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<p>Single-phase three-level neutral-point-clamped (3L-NPC) rectifiers are widely used in high-reliability applications where balanced thermal management is critical. However, the inherent junction temperature imbalance in these rectifiers poses reliability challenges, particularly under aging conditions of insulated gate bipolar transistors (IGBTs). To address this issue, this paper proposes a finite control set model predictive control (FCS-MPC) strategy that achieves junction temperature balancing, maintains electrical performance, and adapts to IGBT degradation simultaneously. First, a power prediction model and a neutral-point potential prediction model are developed for the rectifier. Then, a loss prediction model is employed to enable active junction temperature balancing control. Furthermore, IGBT aging assessment metrics are integrated into the loss prediction model to compensate for degradation effects and ensure thermal balancing under aging conditions. A dynamic weighting mechanism is introduced to optimize the multi-objective control performance. The effectiveness of the proposed method is validated through hardware-in-the-loop (HIL) tests, with experimental results demonstrating its superiority over conventional methods.</p>

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FCS-MPC-based temperature balancing method for single-phase three-level rectifiers under IGBT aging conditions

  • 期刊论文

  • 发表日期：

    2025年10月2日

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  • Yunjun Yu,
  • Guanglong Luo,
  • Hongwei Tao,
  • Yunfei He,
  • Zihui Liu

摘要

Single-phase three-level neutral-point-clamped (3L-NPC) rectifiers are widely used in high-reliability applications where balanced thermal management is critical. However, the inherent junction temperature imbalance in these rectifiers poses reliability challenges, particularly under aging conditions of insulated gate bipolar transistors (IGBTs). To address this issue, this paper proposes a finite control set model predictive control (FCS-MPC) strategy that achieves junction temperature balancing, maintains electrical performance, and adapts to IGBT degradation simultaneously. First, a power prediction model and a neutral-point potential prediction model are developed for the rectifier. Then, a loss prediction model is employed to enable active junction temperature balancing control. Furthermore, IGBT aging assessment metrics are integrated into the loss prediction model to compensate for degradation effects and ensure thermal balancing under aging conditions. A dynamic weighting mechanism is introduced to optimize the multi-objective control performance. The effectiveness of the proposed method is validated through hardware-in-the-loop (HIL) tests, with experimental results demonstrating its superiority over conventional methods.