Transient current stress optimization method for dual-active-bridge DC–DC converters
摘要
The dual-active-bridge (DAB) converter is widely employed in solid-state transformers due to its high efficiency and flexibility in power conversion. However, transient current stress can arise due to factors such as load variations and power reversals. This issue is typically mitigated by line resistance over long time scales. However, in the short term, transient current stress can pose a significant challenge to the safe operation of DAB converters. DAB converters have 12 steady operation modes and 144 transient cases under the traditional model. The traditional model is so complex that the existing current stress optimization methods primarily focus on steady current stress, and leave the optimization of the transient current stress caused by transient bias current largely unaddressed. In this paper, a simplified DAB model utilizing 3 steady operational modes and 9 transient cases is proposed. Additionally, an extra phase shift ratio is introduced to eliminate transient bias current, where its analytical expression is derived for all transient scenarios. Finally, the correctness of the derivation process and the effectiveness of the proposed method are validated through experimental results obtained from a laboratory prototype.