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<p>Among the various pests of the crop, lepidopteran pests, especially <i>Spodoptera exigua</i> Hübner and <i>Agrotis segetum</i> Denis and Schiffermüller (Lepidoptera: Noctuidae), cause severe damage every year. This research was performed to develop a fixed-precision sequential sampling plan to monitor these pests in sugar beet fields. Taylor’s power law and Iwao’s patchiness models were used to determine the spatial distribution pattern and parameters of each pest. The data fit Taylor’s power law better than Iwao’s patchiness. Green’s model was used for developing the fixed-precision sequential sampling plan of these pest larvae. For <i>S. exigua</i>, the optimum sample size (OSS) varied from 0.1 to 49 at a precision level of 0.1 and from 0.1 to 17.5 at a precision level of 0.25, depending on the larval density. Sampling must continue until a minimum of 10 larvae (D = 0.25) or 29 larvae (D = 0.1) are cumulatively collected. The OSS for <i>A. segetum</i> on sugar beet plants ranged between 0.6 and 16.1 and between 1.9 and 46.6 plants at precision levels of 0.25 and 0.1, respectively. For <i>A. segetum</i> on sugar beets, the estimated sampling stop lines were 18.1 (for a precision level of 0.25) and 61.3 (for a precision level of 0.1). For both pests, the needed OSS at a precision level of 0.1 was greater than that at a precision level of 0.25. By increasing the larval density, the needed OSS dramatically decreased.</p>

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Development of a fixed-precision sequential sampling plan for two important noctuid pests, Spodoptera exigua hübner and Agrotis segetum Denis and Schiffermüller, in the sugar beet fields of Khuzestan Province, southwestern Iran

  • 期刊论文

  • 发表日期：

    2025年12月23日

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  • Ali Rajabpour,
  • Masoud Shahabi

摘要

Among the various pests of the crop, lepidopteran pests, especially Spodoptera exigua Hübner and Agrotis segetum Denis and Schiffermüller (Lepidoptera: Noctuidae), cause severe damage every year. This research was performed to develop a fixed-precision sequential sampling plan to monitor these pests in sugar beet fields. Taylor’s power law and Iwao’s patchiness models were used to determine the spatial distribution pattern and parameters of each pest. The data fit Taylor’s power law better than Iwao’s patchiness. Green’s model was used for developing the fixed-precision sequential sampling plan of these pest larvae. For S. exigua, the optimum sample size (OSS) varied from 0.1 to 49 at a precision level of 0.1 and from 0.1 to 17.5 at a precision level of 0.25, depending on the larval density. Sampling must continue until a minimum of 10 larvae (D = 0.25) or 29 larvae (D = 0.1) are cumulatively collected. The OSS for A. segetum on sugar beet plants ranged between 0.6 and 16.1 and between 1.9 and 46.6 plants at precision levels of 0.25 and 0.1, respectively. For A. segetum on sugar beets, the estimated sampling stop lines were 18.1 (for a precision level of 0.25) and 61.3 (for a precision level of 0.1). For both pests, the needed OSS at a precision level of 0.1 was greater than that at a precision level of 0.25. By increasing the larval density, the needed OSS dramatically decreased.