<p>The search for stable, cost-effective, and environmentally friendly materials has sparked increasing interest in lead-free perovskites. In this work, we investigate the potential of the lead-free perovskite, formamidinium bismuth bromide (FA<sub>3</sub>Bi<sub>2</sub>Br<sub>9</sub>) NCs, as the stable active layer material in memristor devices, focusing on their structural, electrical, and resistive switching (RS) properties. X-ray diffraction and Raman spectroscopy confirmed phase purity and stable vibrational characteristics of the material over a period of four weeks. Electrical characterization through current-voltage (I–V) measurements revealed typical bipolar resistive switching, with a low SET voltage of approximately 0.26&#xa0;V and consistent switching performance throughout the study period. Analysis of the switching mechanism indicated trap-controlled space charge-limited conduction (SCLC) in the high resistance state (HRS) and Ohmic conduction in the low resistance state (LRS). The LRS current and SET voltage corresponded to a steady power consumption of roughly 0.51 mW, demonstrating the low-power operation of these devices. Retention testing confirmed non-volatile behavior, with an HRS/LRS ratio of 10<sup>5</sup> maintained for over 6000&#xa0;min at a read voltage of 0.5&#xa0;V. The observed correlation between impedance response and memristor performance highlights the structural and electrical stability of FA<sub>3</sub>Bi<sub>2</sub>Br<sub>9−</sub>based devices, supporting their suitability for reliable, low-power memory applications.</p>

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Lead-free Formamidinium Bismuth Bromide Perovskites for Memristor applications: a lead-free approach to sustainable electronics

  • Amrita Singh,
  • Saral Kumar Gupta,
  • C. M. S. Negi

摘要

The search for stable, cost-effective, and environmentally friendly materials has sparked increasing interest in lead-free perovskites. In this work, we investigate the potential of the lead-free perovskite, formamidinium bismuth bromide (FA3Bi2Br9) NCs, as the stable active layer material in memristor devices, focusing on their structural, electrical, and resistive switching (RS) properties. X-ray diffraction and Raman spectroscopy confirmed phase purity and stable vibrational characteristics of the material over a period of four weeks. Electrical characterization through current-voltage (I–V) measurements revealed typical bipolar resistive switching, with a low SET voltage of approximately 0.26 V and consistent switching performance throughout the study period. Analysis of the switching mechanism indicated trap-controlled space charge-limited conduction (SCLC) in the high resistance state (HRS) and Ohmic conduction in the low resistance state (LRS). The LRS current and SET voltage corresponded to a steady power consumption of roughly 0.51 mW, demonstrating the low-power operation of these devices. Retention testing confirmed non-volatile behavior, with an HRS/LRS ratio of 105 maintained for over 6000 min at a read voltage of 0.5 V. The observed correlation between impedance response and memristor performance highlights the structural and electrical stability of FA3Bi2Br9−based devices, supporting their suitability for reliable, low-power memory applications.