<p>In this study, the mechanism and characteristics of the response <InlineEquation ID="IEq4"> <EquationSource Format="TEX">$\alpha$</EquationSource> <EquationSource Format="MATHML"><math> <mi>α</mi> </math></EquationSource> </InlineEquation> particles and the damage caused by them in CMOS active pixel (APS) sensors were investigated. A detection and compensation algorithm for dead pixels caused by <InlineEquation ID="IEq5"> <EquationSource Format="TEX">$\alpha$</EquationSource> <EquationSource Format="MATHML"><math> <mi>α</mi> </math></EquationSource> </InlineEquation> particle ionizing radiation was proposed, and the effects of dead-pixel compensation algorithms were compared and analyzed under different parameter conditions. The experimental results show that <InlineEquation ID="IEq6"> <EquationSource Format="TEX">$\alpha$</EquationSource> <EquationSource Format="MATHML"><math> <mi>α</mi> </math></EquationSource> </InlineEquation> particle response signal has highest accuracy at 9 dB gain, with an obvious “target-ring” distribution. With increasing cumulative dose, the CMOS APS pedestal tends to saturation while dead pixels continue increasing. Though some pixel damage recovers through natural annealing, the dead-to-noise ratio increases with irradiation time, reaching 32.54<InlineEquation ID="IEq7"> <EquationSource Format="TEX">$\%$</EquationSource> <EquationSource Format="MATHML"><math> <mo>%</mo> </math></EquationSource> </InlineEquation> after 72 h. A hierarchical clustering dead-pixel detection method is proposed, categorizing pixels into two types: those within and outside the response event. A classification compensation strategy combining mean and majority filtering is proposed. This compensation algorithm can address dead-pixel interference without affecting <InlineEquation ID="IEq8"> <EquationSource Format="TEX">$\alpha$</EquationSource> <EquationSource Format="MATHML"><math> <mi>α</mi> </math></EquationSource> </InlineEquation> particle radiation response data. When iterated multiple times and with integration time exceeding 6.31 ms, the number of dead pixels can be effectively reduced.</p>

$\alpha$ ionizing particle radiation detection and damage compensation methods for CMOS active pixel sensors

期刊论文
发表日期：

2026年2月3日

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Shou-Long Xu,
Cui-Yue Wei,
Zhi-Wei Qin,
Shu-Liang Zou,
Yong-Chao Han,
Qing-Yang Wei,
You-Jun Huang

摘要

In this study, the mechanism and characteristics of the response $\alpha$ $α$ particles and the damage caused by them in CMOS active pixel (APS) sensors were investigated. A detection and compensation algorithm for dead pixels caused by $\alpha$ $α$ particle ionizing radiation was proposed, and the effects of dead-pixel compensation algorithms were compared and analyzed under different parameter conditions. The experimental results show that $\alpha$ $α$ particle response signal has highest accuracy at 9 dB gain, with an obvious “target-ring” distribution. With increasing cumulative dose, the CMOS APS pedestal tends to saturation while dead pixels continue increasing. Though some pixel damage recovers through natural annealing, the dead-to-noise ratio increases with irradiation time, reaching 32.54 $\%$ $%$ after 72 h. A hierarchical clustering dead-pixel detection method is proposed, categorizing pixels into two types: those within and outside the response event. A classification compensation strategy combining mean and majority filtering is proposed. This compensation algorithm can address dead-pixel interference without affecting $\alpha$ $α$ particle radiation response data. When iterated multiple times and with integration time exceeding 6.31 ms, the number of dead pixels can be effectively reduced.

\(\alpha\) ionizing particle radiation detection and damage compensation methods for CMOS active pixel sensors

摘要