Sub-millimeter Imaging Using Line Scan Camera for Tunnel Applications: System Design and Evaluations
摘要
Tunnels are essential components of modern transportation infrastructure, where their structural integrity is crucial for ensuring the safety and efficiency of train operations as well as public security. This study introduces an innovative submillimeter imaging inspection method for tunnels, leveraging line scan cameras to simultaneously address the challenges of achieving high-resolution imaging and optimized data processing. A comprehensive tunnel imaging inspection system, integrating both hardware and software components with multiple synchronized line scan cameras to achieve high-speed, wide-area imaging. To address image distortions, a robust correction framework was developed, incorporating lens shadow correction, white balance adjustment, directional alignment, tilt correction, and orthorectification. Furthermore, an innovative multi-view image stitching method was introduced, in which pixel energy in overlapping regions was defined based on structural and color differences to guide seam selection and blending. Dynamic programming was employed to determine globally optimal stitching lines, effectively mitigating ghosting and double images caused by uneven lighting and parallax while maintaining high processing efficiency. The system is compatible with both monochrome and color line scan cameras, offering versatility to adapt to diverse project requirements. Extensive field tests in metro and high-speed rail tunnels demonstrated that the system can achieve a spatial resolution of 0.2 mm/pixel, which qualifies as submillimeter-level resolution. This high-resolution imaging capability enables the precise detection of small cracks, spalling, and other surface defects, providing an efficient, automated, and accurate alternative to traditional inspection methods. This advancement significantly improves tunnel maintenance operations.