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<p>With the rise of modern technology, counterfeit products have become widespread, increasing the demand for advanced anti-counterfeiting solutions. Inspired by the random wrinkles on peanut surfaces, this paper proposes a biologically physical unclonable function (PUF) label with an all-optical anti-counterfeiting. Using spatially selective plasma etching technology, a single material random wrinkling strategy is designed. This overcomes the limitations of traditional double-layer wrinkling, such as low entropy and complex processes, enabling selective wrinkling in fixed areas. In addition, the innovative introduction of dual-modal luminescent micron defects in polydimethylsiloxane films enables orthogonal control and coordination of the frequency domain of unpredictable wrinkles at the mesoscopic scale, promoting the transition from long-range anisotropy to short-range isotropy. It is worth noting that the verification process only requires simple optical equipment, providing cost-effectiveness and ease of detection. This anti-counterfeiting system incorporates three collaborative security mechanisms: (i) high-entropy PUF encoded wrinkle fingerprints, (ii) angle-sensitive Bragg-like structural colors, and (iii) spatially segmented dual-mode fluorescence. The anti-counterfeiting label has wide applicability in secure packaging, high-value product labels, and smart encryption, and has the potential to be extended to flexible electronics and wearable security systems.</p>

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Functional micro-defect modified plasma-induced physical unclonable function wrinkle labels exhibiting dual-mode luminescence and angle-tunable structural colors

  • 期刊论文

  • 发表日期：

    2026年1月7日

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  • Shiyu Deng,
  • Yan Li,
  • Jinyue Xie,
  • Ye Tian,
  • Huan Tang,
  • Ziyu Chen,
  • Yanyan Li,
  • Feng Song,
  • Wei Huang

摘要

With the rise of modern technology, counterfeit products have become widespread, increasing the demand for advanced anti-counterfeiting solutions. Inspired by the random wrinkles on peanut surfaces, this paper proposes a biologically physical unclonable function (PUF) label with an all-optical anti-counterfeiting. Using spatially selective plasma etching technology, a single material random wrinkling strategy is designed. This overcomes the limitations of traditional double-layer wrinkling, such as low entropy and complex processes, enabling selective wrinkling in fixed areas. In addition, the innovative introduction of dual-modal luminescent micron defects in polydimethylsiloxane films enables orthogonal control and coordination of the frequency domain of unpredictable wrinkles at the mesoscopic scale, promoting the transition from long-range anisotropy to short-range isotropy. It is worth noting that the verification process only requires simple optical equipment, providing cost-effectiveness and ease of detection. This anti-counterfeiting system incorporates three collaborative security mechanisms: (i) high-entropy PUF encoded wrinkle fingerprints, (ii) angle-sensitive Bragg-like structural colors, and (iii) spatially segmented dual-mode fluorescence. The anti-counterfeiting label has wide applicability in secure packaging, high-value product labels, and smart encryption, and has the potential to be extended to flexible electronics and wearable security systems.