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<p>Precise overlay alignment within ± 25&#xa0;µm is critical in roll-to-roll (R2R) gravure printing of flexible thin-film transistors (TFTs) to ensure stable device performance and enable high-yield, sustainable production. However, printing defects such as drag-out tails and pinholes can distort register sensing, resulting in erroneous alignment compensation and subsequent quality degradation. In this study, we present a defect-aware register sensing and alignment-correction method for R2R-printed electronics that explicitly identifies and compensates for additional errors induced by printing defects. Drag-out tails and pinholes are detected using an edge-density analysis and a circular Hough transform, respectively, and are masked from register-mark images prior to centroid-based alignment estimation. Experiments conducted under production-relevant conditions demonstrate that the proposed approach reduces mean registration errors by approximately 70–80% in both the machine direction and the cross-machine direction. For instance, under high web-tension conditions, misalignment is reduced from approximately 140&#xa0;µm to about 30&#xa0;µm. Furthermore, misaligned devices exhibit more than a fourfold increase in line-resistance variability compared with well-aligned devices, confirming that layer misregistration directly degrades electrical performance. These results highlight the importance of defect-aware register control for achieving high-yield, green manufacturing of flexible electronics.</p> Graphical Abstract <p></p>

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Quality-Assured Roll-to-Roll Flexible Printed Electronics: Defect-Robust Register Sensing and Alignment Correction

  • 期刊论文

  • 发表日期：

    2026年1月26日

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  • Sangbin Lee,
  • Minjae Kim,
  • Junyoung Yun,
  • Jeongdai Jo,
  • Youngcheol Jeong,
  • Changwoo Lee

摘要

Precise overlay alignment within ± 25 µm is critical in roll-to-roll (R2R) gravure printing of flexible thin-film transistors (TFTs) to ensure stable device performance and enable high-yield, sustainable production. However, printing defects such as drag-out tails and pinholes can distort register sensing, resulting in erroneous alignment compensation and subsequent quality degradation. In this study, we present a defect-aware register sensing and alignment-correction method for R2R-printed electronics that explicitly identifies and compensates for additional errors induced by printing defects. Drag-out tails and pinholes are detected using an edge-density analysis and a circular Hough transform, respectively, and are masked from register-mark images prior to centroid-based alignment estimation. Experiments conducted under production-relevant conditions demonstrate that the proposed approach reduces mean registration errors by approximately 70–80% in both the machine direction and the cross-machine direction. For instance, under high web-tension conditions, misalignment is reduced from approximately 140 µm to about 30 µm. Furthermore, misaligned devices exhibit more than a fourfold increase in line-resistance variability compared with well-aligned devices, confirming that layer misregistration directly degrades electrical performance. These results highlight the importance of defect-aware register control for achieving high-yield, green manufacturing of flexible electronics.

Graphical Abstract