Scholarlink

<p>This study addresses the lack of accurate discrete element method (DEM) models for <i>Glycyrrhiza glabra</i> stem harvesting and crushing devices. By analyzing the stem microstructure and intrinsic properties, physical parameters (Poisson’s ratio, shear modulus, restitution, and friction coefficients) and bonding parameters (contact stiffnesses, critical stresses, bonding radius) were calibrated using DEM simulations. Plackett–Burman, Steepest Ascent, and Box–Behnken experimental designs optimized these parameters through angle of repose and radial compression tests. Validation showed a 3.58% relative error between simulated and experimental angle of repose and a 2.83% error for compression breaking forces. The calibrated parameters accurately reflect <i>Glycyrrhiza</i> stems’ mechanical properties, enabling reliable DEM-based device design.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Establishment and parameter calibration of discrete element model for glycyrrhiza stem compression simulation

  • 期刊论文

  • 发表日期：

    2025年8月14日

查看全文
  • Zhaokun Zhang,
  • Na Liu,
  • Jingbin Li,
  • Honglei Cen,
  • Jing Nie,
  • Baoqin Wen,
  • Wenhui Jing,
  • Lulu Nie,
  • Rushuo Bai,
  • Mingjian Zhang,
  • Xinyi Ma

摘要

This study addresses the lack of accurate discrete element method (DEM) models for Glycyrrhiza glabra stem harvesting and crushing devices. By analyzing the stem microstructure and intrinsic properties, physical parameters (Poisson’s ratio, shear modulus, restitution, and friction coefficients) and bonding parameters (contact stiffnesses, critical stresses, bonding radius) were calibrated using DEM simulations. Plackett–Burman, Steepest Ascent, and Box–Behnken experimental designs optimized these parameters through angle of repose and radial compression tests. Validation showed a 3.58% relative error between simulated and experimental angle of repose and a 2.83% error for compression breaking forces. The calibrated parameters accurately reflect Glycyrrhiza stems’ mechanical properties, enabling reliable DEM-based device design.