<p>It is very common for several competing failure causes to exist simultaneously during reliability life testing. This problem is often called the competing risks or failure model since it encompasses ways in which failures can occur; however only the shortest time to failure and its corresponding mode are typically recognized. This study examines a competing risk model, under stress conditions taking into account type II censoring. The relationship, between competing risks is represented using a Marshall Olkin bivariate model. The q-bivariate Marshall Olkin exponential model is characterized by a decreasing hazard rate, for both variables. We conducted a simulation study to understand the model under consideration. After applying the suggested model to a stress dataset it showed a better fit compared to the traditional Marshall Olkin bivariate exponential model.</p>