<p>Zinc telluride (ZnTe) thin films were deposited on glass substrates using the glancing angle deposition (GLAD) technique under high vacuum. The effect of deposition angle on the structural and optical properties of the films was systematically studied. X-ray diffraction (XRD) analysis revealed that varying the incident vapor angle significantly influenced the crystallographic orientation, grain size, and overall crystallinity. All samples exhibited a cubic zinc-blende structure, with a shift in preferred orientation as the deposition angle increased. Optical characterization using UV- Vis spectroscopy showed pronounced changes in absorption coefficient, optical band gap, refractive index, and dielectric constant as a function of angle. These variations were attributed to changes in film porosity and anisotropy induced by the self-shadowing effect inherent to GLAD. The results demonstrate the potential of GLAD to precisely tailor the optoelectronic properties of ZnTe films for applications in photonic crystals, angle-sensitive devices, and advanced photovoltaic structures.</p>