Evidence of colossal dielectric constant in ruthenium double perovskite oxide Sr2RuMn1−xFexO6 (0 ≤ x ≤ 0.4)
摘要
In this report, we have performed frequency dependent dielectric study of Sr2RuMn1−xFexO6 (0 ≤ x ≤ 0.4) double perovskite materials synthesized by conventional solid-state route. The initial two samples of the series (x = 0 and 0.1) crystallized in tetragonal structure with space group P4/mmm and last two samples (x = 0.2 and 0.3) crystallized in cubic structure with Pm-3 space group. The frequency dependent dielectric studies of the compounds reveal colossal dielectric constant (~ 107) at different temperatures. The dielectric constant of all the samples maintains a constant value up to 500 kHz. The dielectric behavior of all the compounds is best interpreted using Maxwell–Wagner interfacial polarization model. The Cole–Cole model was used to study the dielectric relaxation of the samples which indicated a polydispersive nature of the dielectric relaxation. The temperature variation of mean relaxation time (