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<p>In the present study, we investigate how varying annealing temperatures affect the structural, morphological, and optical properties of copper-titanium oxide composite films deposited on quartz substrates. A range of characterization techniques, including X-ray diffraction, Raman spectroscopy, scanning electron microscopy, atomic force microscopy, and UV–Vis spectroscopy, were employed to analyze the changes in film characteristics. The results demonstrate that annealing temperature plays a critical role in determining the film’s structural integrity, surface morphology, and optical behavior. The crystallite size increased from 16.97&#xa0;nm at 500&#xa0;°C to 68.07&#xa0;nm at 900&#xa0;°C, while surface roughness rose significantly, reaching 148&#xa0;nm at 1000&#xa0;°C. In addition, SEM analysis showed that particle size expanded from 12.55&#xa0;nm at 400&#xa0;°C to 603.60&#xa0;nm at 900&#xa0;°C. Notably, a strong relationship was found between film transparency and these physical properties, with optical transmittance decreasing from approximately 69% at 400&#xa0;°C to around 2% at 1000&#xa0;°C. Based on the findings, the study proposes optimal annealing conditions for achieving high-quality thin films.</p>

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Annealing Temperature-Driven Evolution of Structure, Morphology, and Optical Behavior in Cu-TiO2 Composite Films

  • 期刊论文

  • 发表日期：

    2025年9月28日

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  • K. Ozel,
  • S. Gürakar,
  • T. Serin,
  • A. Yildiz

摘要

In the present study, we investigate how varying annealing temperatures affect the structural, morphological, and optical properties of copper-titanium oxide composite films deposited on quartz substrates. A range of characterization techniques, including X-ray diffraction, Raman spectroscopy, scanning electron microscopy, atomic force microscopy, and UV–Vis spectroscopy, were employed to analyze the changes in film characteristics. The results demonstrate that annealing temperature plays a critical role in determining the film’s structural integrity, surface morphology, and optical behavior. The crystallite size increased from 16.97 nm at 500 °C to 68.07 nm at 900 °C, while surface roughness rose significantly, reaching 148 nm at 1000 °C. In addition, SEM analysis showed that particle size expanded from 12.55 nm at 400 °C to 603.60 nm at 900 °C. Notably, a strong relationship was found between film transparency and these physical properties, with optical transmittance decreasing from approximately 69% at 400 °C to around 2% at 1000 °C. Based on the findings, the study proposes optimal annealing conditions for achieving high-quality thin films.