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<p>This research presents a one-dimensional photonic crystal structure designed for precise angle and refractive index detection through the optical Tamm state. Utilizing the transfer matrix method, the study explores system characteristics under specific Bragg scattering conditions. The proposed sensor structure incorporates a multi-frequency absorption configuration, achieving absorption rates exceeding 0.9 at three distinct frequency points. Adjustments in the incident Light angle and defect layer thickness induce red and blue shifts in the absorption peaks, while the spacing between these peaks can be controlled by the phase number and defect layer thickness. Among these configurations, one demonstrates exceptional properties, enabling the development of highly efficient refractive index and angle sensors. The structure operates as a refractive index sensor within a range of 1.3 to 2.7, with a sensitivity of 32.389 THz/RIU and an average figure of merit of 70.328. When applied as an angle sensor, it exhibits a sensitivity of 0.533 THz/degree, with a corresponding figure of merit of 1.57, covering an angular range from 30° to 70°. This innovative structure holds significant potential for enhancing sensor applications, contributing to advancements in optical detection and precision measurement.</p>

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Design and Theoretical Study of One-Dimensional Photonic Crystal Sensors for Refractive Index and Incident Angle

  • 期刊论文

  • 发表日期：

    2025年8月11日

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  • Ahmed K. S. AbuAltayef,
  • Anas A. M. Alqanoo,
  • Sofyan A. Taya,
  • K. H. Ibnaouf

摘要

This research presents a one-dimensional photonic crystal structure designed for precise angle and refractive index detection through the optical Tamm state. Utilizing the transfer matrix method, the study explores system characteristics under specific Bragg scattering conditions. The proposed sensor structure incorporates a multi-frequency absorption configuration, achieving absorption rates exceeding 0.9 at three distinct frequency points. Adjustments in the incident Light angle and defect layer thickness induce red and blue shifts in the absorption peaks, while the spacing between these peaks can be controlled by the phase number and defect layer thickness. Among these configurations, one demonstrates exceptional properties, enabling the development of highly efficient refractive index and angle sensors. The structure operates as a refractive index sensor within a range of 1.3 to 2.7, with a sensitivity of 32.389 THz/RIU and an average figure of merit of 70.328. When applied as an angle sensor, it exhibits a sensitivity of 0.533 THz/degree, with a corresponding figure of merit of 1.57, covering an angular range from 30° to 70°. This innovative structure holds significant potential for enhancing sensor applications, contributing to advancements in optical detection and precision measurement.