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<p>In this work, the CdSe thin films were fabricated by the thermal evaporation method on a glass substrate with varying thicknesses (200,218,225 and 254) nm, at room temperature (300&#xa0;K). The films were characterized by using X-ray diffraction, Field Emission Scanning Electron Microscope (FESEM) and optical absorption measurements. The structural features such as the size of the grain and the micro strain of the thin film have been clarified with XRD technique and XRD pattern. The chosen orientation (002) for all prepared film has been crystallized structures (hexagonal). The FE-SEM images illustrate the CdSe nanoparticles, showcasing particles with a uniform and homogenous distribution. The optical properties concerning the absorption spectra were studied for the prepared thin films. The variation of absorption parameters with wavelength was investigated, also the absorption spectrum decreased with increase of wavelength. UV-Visible spectra photometer is used to investigate the visible properties such as absorption, absorption coefficient and energy gaps in thin films.</p>

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Influence of film thickness on the physical properties of CdSe thin films

  • 期刊论文

  • 发表日期：

    2026年1月8日

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  • Mohammed Shareef Mohammed,
  • Seena Essa Khadim,
  • Thair. K. Salah,
  • Noor Lafta Hamdan

摘要

In this work, the CdSe thin films were fabricated by the thermal evaporation method on a glass substrate with varying thicknesses (200,218,225 and 254) nm, at room temperature (300 K). The films were characterized by using X-ray diffraction, Field Emission Scanning Electron Microscope (FESEM) and optical absorption measurements. The structural features such as the size of the grain and the micro strain of the thin film have been clarified with XRD technique and XRD pattern. The chosen orientation (002) for all prepared film has been crystallized structures (hexagonal). The FE-SEM images illustrate the CdSe nanoparticles, showcasing particles with a uniform and homogenous distribution. The optical properties concerning the absorption spectra were studied for the prepared thin films. The variation of absorption parameters with wavelength was investigated, also the absorption spectrum decreased with increase of wavelength. UV-Visible spectra photometer is used to investigate the visible properties such as absorption, absorption coefficient and energy gaps in thin films.