Application of a superpixel-based segmentation method to root micrographs for total fungal colonization rate estimation
摘要
This work illustrates a novel application of a supervised superpixel-based segmentation method for root micrograph classification and total fungal colonization rate estimation. Two procedures relying on successive classifier application on different root micrographs or on the same micrograph but with an increasing number of labels to be assigned to each picture element category are compared to a reference grid-intersect count method. Finally, supervised classification with at least 16 labels on the same picture appears as a convenient method for obtaining rapid and confident colonization rate estimates. We suggest this kind of method may be easily and routinely implemented for research or educational purposes.