Degradation modeling and remaining useful life prediction method for operational amplifiers using the GA-optimized SVR
摘要
Small samples of performance degradation data are commonly obtained during an accelerated degradation test. This study leverages the global search capabilities of heuristic algorithms to enhance the performance of support vector regression (SVR) in degradation modeling with such constrained data, utilizing genetic algorithms to optimally select model parameters. The life prediction results from the Arrhenius model are used as a benchmark in the kernel function selection in the SVR model. Comparative analysis showed that the sigmoid kernel function demonstrated superior nonlinear mapping capabilities and achieved high prediction accuracy. Furthermore, the radial basis function neural network exhibited poorer generalization performance in scenarios involving small sample sizes compared with other models.