<p>To describe the Keim Technique, a novel approach to secondary rhinoplasty which allows improvement of nasal tip definition, projection, and rotation without redoing primary grafts. Qualitative, descriptive, observational, retrospective study. Data were obtained from the electronic medical records of patients treated in private practice by the first author. The study cohort consisted of six female patients who had already undergone primary rhinoplasty but wanted a more delicate and better-defined nasal tip. All underwent secondary rhinoplasty with an open approach using the Keim Technique; the average follow-up time was 18&#xa0;months. Secondary rhinoplasty is a safe surgery with a very low rate of infectious complications. The Keim Technique is a viable option with good short- and medium-term outcomes and excellent patient satisfaction, but it must be performed by an experienced surgeon.</p><p>Level of Evidence: Level II.</p>

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Secondary Rhinoplasty to Improve Nasal Tip Definition, Projection, And Rotation without Revision of Previous Grafts

  • Frederico Santos Keim,
  • Júlia Gaspar de Oliveira Santos

摘要

To describe the Keim Technique, a novel approach to secondary rhinoplasty which allows improvement of nasal tip definition, projection, and rotation without redoing primary grafts. Qualitative, descriptive, observational, retrospective study. Data were obtained from the electronic medical records of patients treated in private practice by the first author. The study cohort consisted of six female patients who had already undergone primary rhinoplasty but wanted a more delicate and better-defined nasal tip. All underwent secondary rhinoplasty with an open approach using the Keim Technique; the average follow-up time was 18 months. Secondary rhinoplasty is a safe surgery with a very low rate of infectious complications. The Keim Technique is a viable option with good short- and medium-term outcomes and excellent patient satisfaction, but it must be performed by an experienced surgeon.

Level of Evidence: Level II.