<p>Memory ICs are vital components in almost all computing systems, where reliability directly influences overall performance. Fault resilience is particularly critical in mission-oriented applications such as defense and space missions. The harsh radiation environment in space, dominated by high-energy particles from solar and cosmic sources, can induce single-event upsets (SEUs) and multiple-node upsets, leading to soft errors and potential system failures. This paper elaborates on the papers which have addressed the space related design challenges, various radiation-hardened-by-design (RHBD) techniques and balancing trade-offs among area, power, and delay. It also provides a comprehensive analysis of radiation effects and mitigation techniques for both volatile and non-volatile memory architectures. It integrates insights from SPICE, TCAD, and FPGA-based simulations to highlight design trade-offs and guide the development of low-power, radiation-tolerant memory systems for future space-grade applications. Recent innovations such as read-decoupled DICE SRAM cells achieve up to 72% reduction in read energy and 67% faster read delay, while transistor-level hardened designs like the RHRSE-20T SRAM demonstrate 255% improvement in read stability and 30% faster access. Hybrid MTJ-CMOS latches and emerging non-volatile memories, including ReRAM and spintronic architectures, further enhance resilience through intrinsic radiation immunity and self-recovery mechanisms.</p>

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An Elaborative Review on RHBD Techniques for Memory Structures

  • S. Jamuna,
  • Sourabh Konkala,
  • Maria L. N. Dayana,
  • Kishore K. Kumar,
  • Hannan Ashrafi,
  • Suraj Malagar,
  • T. Mohammad Nisar,
  • R. Madhura

摘要

Memory ICs are vital components in almost all computing systems, where reliability directly influences overall performance. Fault resilience is particularly critical in mission-oriented applications such as defense and space missions. The harsh radiation environment in space, dominated by high-energy particles from solar and cosmic sources, can induce single-event upsets (SEUs) and multiple-node upsets, leading to soft errors and potential system failures. This paper elaborates on the papers which have addressed the space related design challenges, various radiation-hardened-by-design (RHBD) techniques and balancing trade-offs among area, power, and delay. It also provides a comprehensive analysis of radiation effects and mitigation techniques for both volatile and non-volatile memory architectures. It integrates insights from SPICE, TCAD, and FPGA-based simulations to highlight design trade-offs and guide the development of low-power, radiation-tolerant memory systems for future space-grade applications. Recent innovations such as read-decoupled DICE SRAM cells achieve up to 72% reduction in read energy and 67% faster read delay, while transistor-level hardened designs like the RHRSE-20T SRAM demonstrate 255% improvement in read stability and 30% faster access. Hybrid MTJ-CMOS latches and emerging non-volatile memories, including ReRAM and spintronic architectures, further enhance resilience through intrinsic radiation immunity and self-recovery mechanisms.