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<p>This study investigates the crystallographic and microstructural characteristics of novel multilayer ZMZ thin films (M = Null, Sn, Ag, Al, Au and Cu) thermally evaporated. X-ray diffraction (XRD), field-emission scanning electron microscopy (FE-SEM), and energy dispersive X-ray analysis (EDX) were employed to analyze the microstructure. XRD confirmed the polycrystalline cubic structure for all ZMZ films, with the exception of ZMZ (M = Cu) films, which exhibited a two-phase (cubic and hexagonal) structure. EDX spectra demonstrated good elemental agreement with the deposited compositions. Microstructural parameters, including crystallite size, microstrain, interfacial tension, residual internal stress, and dislocation density, were quantitatively estimated from XRD line profiles using the Scherrer equation, the modified Monshi-Scherrer method, and the Williamson-Hall (W–H) method. Key findings reveal significant quantitative variations influenced by the interlayer metal. Crystallite size ranged from 5.88&#xa0;nm (ZMZ, M = Al) to 16.79&#xa0;nm (ZMZ, M = Au), while microstrain varied from 1.41 × 10<sup>−3</sup> (ZMZ, M = Ag) to 5.03 × 10<sup>−3</sup> (ZMZ, M = Au). Interfacial tension spanned from 1.242 N/m (ZMZ, M = Al) to 11.000 N/m (ZMZ, M = Au). Residual internal stress ranged from 0.638 GPa (ZMZ, M = Al) to 2.165 GPa (ZMZ, M = Cu), and dislocation density varied from 3.547 × 10<sup>7</sup> line/m<sup>2</sup> (ZMZ, M = Au) to 28.923 × 10<sup>7</sup> line/m<sup>2</sup> (ZMZ, M = Al). Notably, the ZMZ (M = Au) films exhibited the largest crystallite size (16.79&#xa0;nm) and lowest dislocation density (3.547 × 10<sup>7</sup> line/m<sup>2</sup>), indicating enhanced crystallinity. Conversely, ZMZ (M = Al) films showed the smallest crystallite size (5.88&#xa0;nm) and highest dislocation density (28.923 × 10<sup>7</sup> line/m<sup>2</sup>). FE-SEM observations revealed smooth, homogeneous surfaces composed of nanoscale grains with sizes ranging from 10 to 60&#xa0;nm. The introduction of a metal interlayer was found to enhance crystallization, leading to increased crystalline agglomeration and reduced crystal imperfections.</p>

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Intensive crystallographic studies, microstructural parameters, and microscopic features of novel nano-sized multilayer ZnTe/M/ZnTe thin films

  • 期刊论文

  • 发表日期：

    2026年7月21日

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  • W. S. Mohamed,
  • Alaa Ahmed Saad Akl,
  • Meshal Alzaid,
  • N. M. A. Hadia,
  • Ahmed Saeed Hassaniend

摘要

This study investigates the crystallographic and microstructural characteristics of novel multilayer ZMZ thin films (M = Null, Sn, Ag, Al, Au and Cu) thermally evaporated. X-ray diffraction (XRD), field-emission scanning electron microscopy (FE-SEM), and energy dispersive X-ray analysis (EDX) were employed to analyze the microstructure. XRD confirmed the polycrystalline cubic structure for all ZMZ films, with the exception of ZMZ (M = Cu) films, which exhibited a two-phase (cubic and hexagonal) structure. EDX spectra demonstrated good elemental agreement with the deposited compositions. Microstructural parameters, including crystallite size, microstrain, interfacial tension, residual internal stress, and dislocation density, were quantitatively estimated from XRD line profiles using the Scherrer equation, the modified Monshi-Scherrer method, and the Williamson-Hall (W–H) method. Key findings reveal significant quantitative variations influenced by the interlayer metal. Crystallite size ranged from 5.88 nm (ZMZ, M = Al) to 16.79 nm (ZMZ, M = Au), while microstrain varied from 1.41 × 10−3 (ZMZ, M = Ag) to 5.03 × 10−3 (ZMZ, M = Au). Interfacial tension spanned from 1.242 N/m (ZMZ, M = Al) to 11.000 N/m (ZMZ, M = Au). Residual internal stress ranged from 0.638 GPa (ZMZ, M = Al) to 2.165 GPa (ZMZ, M = Cu), and dislocation density varied from 3.547 × 107 line/m2 (ZMZ, M = Au) to 28.923 × 107 line/m2 (ZMZ, M = Al). Notably, the ZMZ (M = Au) films exhibited the largest crystallite size (16.79 nm) and lowest dislocation density (3.547 × 107 line/m2), indicating enhanced crystallinity. Conversely, ZMZ (M = Al) films showed the smallest crystallite size (5.88 nm) and highest dislocation density (28.923 × 107 line/m2). FE-SEM observations revealed smooth, homogeneous surfaces composed of nanoscale grains with sizes ranging from 10 to 60 nm. The introduction of a metal interlayer was found to enhance crystallization, leading to increased crystalline agglomeration and reduced crystal imperfections.