Enhanced Bonding of Immiscible Mg/Ta Systems via Cu-Interlayer-Assisted Two-Step Thermomechanical Processing
摘要
Lightweight Mg alloys combined with radiation-shielding Ta hold promise for multifunctional aerospace laminates, but direct bonding is hindered by immiscibility, large melting point disparity, and crystal structure mismatch. Here, a two-step Cu-interlayer diffusion bonding strategy is developed to overcome these challenges. Bonding below the Mg-Cu eutectic temperature (485 °C) forms a layered interface containing brittle Mg2Cu, limiting shear strength to 20.5 MPa. At 500 °C, a solid-liquid eutectic reaction (L ↔ α-Mg + Mg2Cu) reconstructs the interface into a ~ 100-μm-thick multiphase layer, eliminating voids and raising shear strength to 55 Mpa—nearly five times that of direct Mg/Ta bonding. This work not only enables high-strength Mg/Ta joints but also, for the first time, elucidates the influence of the interlayer and bonding temperature on interface evolution, providing a feasible route for fabricating lightweight, radiation-shielding dissimilar laminates.