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<p>The growing demand for lightweight and broadband electromagnetic interference (EMI) shielding requires materials with controlled impedance matching, depth-dependent attenuation, and stable performance under operating conditions. Conventional filler-based composites often provide high total shielding effectiveness (SE<sub>T</sub>), but their electromagnetic response is usually governed by composition, filler loading, and abrupt internal interfaces, which limits independent control of reflection (SE<sub>R</sub>), absorption (SE<sub>A</sub>), and through-thickness property gradients. This review examines ion- and electron-beam irradiation as post-synthesis tools for defect engineering in EMI-shielding composites. Irradiation-induced vacancies, nanowelded carbon junctions, defect-mediated interphases, magnetic disorder, and tracks produced by swift heavy ions (SHI) can modify charge transport, polarization, and magnetic-loss processes without changing the bulk formulation. These mechanisms enable spatial tuning of electrical conductivity <i>σ</i>(<i>z</i>), permittivity <i>ε</i>(<i>z</i>), and magnetic permeability <i>μ</i>(<i>z</i>), allowing conductive surface regions, impedance-matching interphases, and lossy internal zones to be introduced within monolithic films or composites. The review links irradiation regimes, stopping mechanisms, fluence, and defect archetypes to shielding performance, with emphasis on the SE<sub>R</sub>/SE<sub>A</sub> balance, bandwidth, stability, reproducibility, and scalability. The analysis highlights irradiation-assisted defect engineering as a specialized but versatile route for designing graded, absorption-oriented EMI shields for selected aerospace, defense, and high-frequency electronic applications.</p> Graphical Abstract <p></p> <p>High-energy ion beams generate depth-resolved defect profiles, including nanowelded carbon junctions, vacancy complexes in oxides, and nanochannels induced by swift heavy ions (SHI), enabling tunable control over σ(z), ε(z), and μ(z). These irradiation-tailored microstructures support lightweight, broadband EMI shielding.</p>

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Irradiation-Assisted Defect Engineering in EMI-Shielding Composites: From Beam Regimes to Property Gradients

  • 期刊论文

  • 发表日期：

    2026年6月17日

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  • Eugeniy Beliayev,
  • Serguei Chiriaev,
  • Shivalingayya Gaddimath,
  • Yogendra Kumar Mishra

摘要

The growing demand for lightweight and broadband electromagnetic interference (EMI) shielding requires materials with controlled impedance matching, depth-dependent attenuation, and stable performance under operating conditions. Conventional filler-based composites often provide high total shielding effectiveness (SET), but their electromagnetic response is usually governed by composition, filler loading, and abrupt internal interfaces, which limits independent control of reflection (SER), absorption (SEA), and through-thickness property gradients. This review examines ion- and electron-beam irradiation as post-synthesis tools for defect engineering in EMI-shielding composites. Irradiation-induced vacancies, nanowelded carbon junctions, defect-mediated interphases, magnetic disorder, and tracks produced by swift heavy ions (SHI) can modify charge transport, polarization, and magnetic-loss processes without changing the bulk formulation. These mechanisms enable spatial tuning of electrical conductivity σ(z), permittivity ε(z), and magnetic permeability μ(z), allowing conductive surface regions, impedance-matching interphases, and lossy internal zones to be introduced within monolithic films or composites. The review links irradiation regimes, stopping mechanisms, fluence, and defect archetypes to shielding performance, with emphasis on the SER/SEA balance, bandwidth, stability, reproducibility, and scalability. The analysis highlights irradiation-assisted defect engineering as a specialized but versatile route for designing graded, absorption-oriented EMI shields for selected aerospace, defense, and high-frequency electronic applications.

Graphical Abstract

High-energy ion beams generate depth-resolved defect profiles, including nanowelded carbon junctions, vacancy complexes in oxides, and nanochannels induced by swift heavy ions (SHI), enabling tunable control over σ(z), ε(z), and μ(z). These irradiation-tailored microstructures support lightweight, broadband EMI shielding.