Influence of SiO2 on the ionic conductivity parameters and short-range order structure of Ag2O-Al2O3-P2O5 glasses
摘要
This study investigates the effect of SiO2 addition on ionic conductivity and stability against crystallization in Ag2O-Al2O3-P2O5 glasses. It is shown that there is an increase in ionic conductivity values, crystallization stability, and glass transition temperature and a decrease in activation energy of the samples with increasing SiO2 content. This improvement is attributed to the cross-linking of phosphate structures by Q2P, Q3P, Q4P, and possibly Q6Si structural units integrated into the glass matrix, leading to the formation of Si–O-Si, Si–O-Al and Si–O-P bonds. The presence of Q2Si structural units within phosphate chains contributes to an increase in their average length. The increase in the free volume and volume concentration of charge carriers and the decrease in steric hindrance to diffusion resulting from structural transformations have a positive effect on ionic conductivity. It has been shown that an increase in SiO2 content from 0 to 15 mol% results in a 4.75-fold increase in specific ionic conductivity, from 1.06 to 5.04 S·cm−1 at 393 K, accompanied by a decrease in activation energy from 0.62 to 0.52 eV.