High-Precision Polarization Detector Based on Metasurface
摘要
Detection of the optical polarization states is attractive and promising for various polarization-related applications. In this study, we numerically present two different kinds of compact, crosstalk-free, and highly accurate polarization detectors, a symmetric dielectric metasurface and a chiral dielectric metasurface. The two metasurface designs consist of silicon dielectric resonators periodically arranged on top of SiO2 substrate. The optical transmission characteristics of the proposed designs are analyzed using the Finite-Difference Time-Domain (FDTD) Solutions. For linearly polarized light, polarization angle deviation is determined to be less than 4.5° resulted from the relationship between the transmittance of two metasurfaces and the polarization angle of the incident light. The polarization state of nonlinearly polarized light is calculated using the Stokes-Muller formula. The errors for all four types of elliptically polarized light are under 0.0017, verifying measurement precision. Besides from operating within near-infrared wavelength spectrum, the features of compact size, high accuracy, and simple design in these polarization detectors render them exceptionally well-suited for military surveillance, biosensing, environmental monitoring, and various other applications.