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Temperature-dependent wakeup behavior in back-end-of-line compatible ultra-thin HfxZr1−xO2 ferroelectric film

  • Xiaopeng Li,
  • Lu Tai,
  • Xiaoyu Dou,
  • Yang Feng,
  • Dong Zhang,
  • Xuepeng Zhan,
  • Jixuan Wu,
  • Xiao Gong,
  • Jiezhi Chen
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