<p>The rapid recombination of photogenerated charge carriers and the poor stability of metal sulfides remain bottlenecks limiting their practical applications. In this study, sulfur vacancies were introduced into an S-scheme AgIn<sub>5</sub>S<sub>8</sub>/Bi<sub>2</sub>S<sub>3</sub> heterojunction via an <i>in situ</i> hydrothermal method. The sulfur vacancies induced charge density redistribution within the heterojunction and generated efficient active sites for electrons, thereby creating a localized electron-rich environment. The synergistic effects of the sulfur vacancies, internal electric field, and defect energy levels accelerated the separation and transfer of photogenerated charge carriers via the S-scheme pathway, thereby enhancing the visible-light photocatalytic performance, by achieving a Cr(VI) reduction efficiency of 99.6%. More importantly, the long-term stability and excellent anti-interference capability of the S-scheme AgIn<sub>5</sub>S<sub>8</sub>/Bi<sub>2</sub>S<sub>3</sub> heterojunction demonstrate its practical application potential, achieving 98.9% Cr(VI) removal from real electroplating wastewater and meeting discharge standards. This work provides a theoretical basis for constructing highly-catalytic S-scheme heterojunctions and serves as a promising solution for Cr(VI)-containing electroplating wastewater treatment.</p>

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Sulfur-vacancy-induced charge density redistribution for efficient photocatalytic Cr(VI) reduction in an S-scheme AgIn5S8/Bi2S3 heterojunction

  • Shuqin Bao,
  • Aiqin Zhang,
  • Ren He,
  • Fang Deng,
  • Yongcai Zhang,
  • Ahmad Munir,
  • Jianping Zou

摘要

The rapid recombination of photogenerated charge carriers and the poor stability of metal sulfides remain bottlenecks limiting their practical applications. In this study, sulfur vacancies were introduced into an S-scheme AgIn5S8/Bi2S3 heterojunction via an in situ hydrothermal method. The sulfur vacancies induced charge density redistribution within the heterojunction and generated efficient active sites for electrons, thereby creating a localized electron-rich environment. The synergistic effects of the sulfur vacancies, internal electric field, and defect energy levels accelerated the separation and transfer of photogenerated charge carriers via the S-scheme pathway, thereby enhancing the visible-light photocatalytic performance, by achieving a Cr(VI) reduction efficiency of 99.6%. More importantly, the long-term stability and excellent anti-interference capability of the S-scheme AgIn5S8/Bi2S3 heterojunction demonstrate its practical application potential, achieving 98.9% Cr(VI) removal from real electroplating wastewater and meeting discharge standards. This work provides a theoretical basis for constructing highly-catalytic S-scheme heterojunctions and serves as a promising solution for Cr(VI)-containing electroplating wastewater treatment.