Simulation Model for Compressive X-ray Compton Backscattering Imaging Based on Coded Illumination
摘要
Compton backscatter imaging (CBI) is a technique detecting the presence of low atomic number materials for a target with a one-side inspection modality. Unlike scanning the target with a pencil or fan beam, the full-field illumination can eliminate the complex and high-precision collimation structure and effectively reduce scanning time. This paper proposes the architecture model of the compressive x-ray Compton backscattering imager (CXCBI) by using the cone-beam X-ray and coding aperture. The CXCBI model was developed and tested using Montecarlo simulations through GATE, which also was evaluated under several conditions and with different materials and structural details as targets. Imaging reconstructions were performed through denoising-prior-based inverse problem algorithms. The simulation experiment results in GATE indicated the viability of CXCBI architecture model for unilateral detection of composite structures.