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<p>Alumina is a material used in a wide range of applications, like optics and thin films technology. It is also employed for fabrication of lenses with high refractive index. This paper analyzes the backscattered light as function of the polarization state, wavelength, and the incidence angle. In our study, we chose two samples of alpha alumina (α-Al<sub>2</sub>O<sub>3</sub>) with different particle sizes which have been compared with microscopic measurements. The obtained results using an experimental setup described below and the Mie calculation are in agreement with the results of the microscope. The same technique makes possible, by varying the polarization state, to obtain information about morphology and average particle sizes.</p>

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Measurement of the polarized light backscattering by alpha alumina (α-Al2O3)

  • 期刊论文

  • 发表日期：

    2026年6月22日

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  • El-yazid Kerma,
  • Kouider Ferria,
  • Khaled Ayadi

摘要

Alumina is a material used in a wide range of applications, like optics and thin films technology. It is also employed for fabrication of lenses with high refractive index. This paper analyzes the backscattered light as function of the polarization state, wavelength, and the incidence angle. In our study, we chose two samples of alpha alumina (α-Al2O3) with different particle sizes which have been compared with microscopic measurements. The obtained results using an experimental setup described below and the Mie calculation are in agreement with the results of the microscope. The same technique makes possible, by varying the polarization state, to obtain information about morphology and average particle sizes.