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<p>In this study, nanostructured Cd<sub>x</sub>Ni<sub>1−x</sub>Fe<sub>2</sub>O<sub>4</sub>(0 ≤ x ≤ 0.9) thin films were deposited on silicon substrates using pulsed laser deposition (PLD), and their structural, optical, and gas-sensing properties were thoroughly examined. X-ray diffraction analysis indicated that the samples possess a single-phase inverse spinel structure, with the average crystallite size decreasing from 13&#xa0;nm (x = 0) to 8&#xa0;nm (x = 0.9). The average grain size of Cd increased from 62.95 to 98.74&#xa0;nm, as shown by atomic force microscopy, and the maximum surface roughness was 6.1&#xa0;nm at x = 0.7. Optical measurements, which are associated with enhanced electronic polarizability, demonstrated improved UV photon absorption. Gas-sensing tests for 70 ppm NO<sub>2</sub> revealed a substantial increase in sensitivity, reaching a maximum of 145% at an optimal operating temperature of 200&#xa0;°C, with the fastest response time of 4.7&#xa0;s at x = 0.9 and a recovery time of approximately 21&#xa0;s. These findings unequivocally demonstrate that well-controlled Cd doping significantly enhances the surface reactivity and electronic transport of Cdxni1-xfe2o4 thin films, making PLD-grown compositions highly competitive and effectively adjustable candidates for NO2 detection.</p>

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Effect of cadmium doping on gas sensitivity for CdxNi1−xFe2O4 thin films prepared via pulsed laser deposition on silicon substrate

  • 期刊论文

  • 发表日期：

    2025年10月11日

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  • Farah T. M. Noori,
  • Mohammed W. Muayad,
  • Uday M. Nayef,
  • Kareem H. Jawad,
  • Muayed Y. Kdhair,
  • A. Kadhim,
  • Ayat A. Salman,
  • Abbas M. Ali,
  • Abrar Z. AbdulKadhim

摘要

In this study, nanostructured CdxNi1−xFe2O4(0 ≤ x ≤ 0.9) thin films were deposited on silicon substrates using pulsed laser deposition (PLD), and their structural, optical, and gas-sensing properties were thoroughly examined. X-ray diffraction analysis indicated that the samples possess a single-phase inverse spinel structure, with the average crystallite size decreasing from 13 nm (x = 0) to 8 nm (x = 0.9). The average grain size of Cd increased from 62.95 to 98.74 nm, as shown by atomic force microscopy, and the maximum surface roughness was 6.1 nm at x = 0.7. Optical measurements, which are associated with enhanced electronic polarizability, demonstrated improved UV photon absorption. Gas-sensing tests for 70 ppm NO2 revealed a substantial increase in sensitivity, reaching a maximum of 145% at an optimal operating temperature of 200 °C, with the fastest response time of 4.7 s at x = 0.9 and a recovery time of approximately 21 s. These findings unequivocally demonstrate that well-controlled Cd doping significantly enhances the surface reactivity and electronic transport of Cdxni1-xfe2o4 thin films, making PLD-grown compositions highly competitive and effectively adjustable candidates for NO2 detection.