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<p>In this study, phosphorus-doped cobalt oxide thin films were synthesized via spray pyrolysis for photo-electrocatalyst applications. The influence of structural phase transformation on the optical properties and bandgap of phosphorus cobalt oxide semiconducting thin films was investigated through post-annealing under argon gas and phosphorus atmosphere. To study the structural, optical, electrical and surface morphological characteristics, various techniques were employed, including X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectroscopy (EDX), and UV–Vis spectroscopy. The XRD analysis revealed that prior to post-annealing in the phosphorus atmosphere, the thin films predominantly exhibited cobalt oxide phases. However, after thermal treatment, most films showed a dominant presence of bi-phase and tri-phase phosphorus cobalt oxide structures. Optical analysis indicated that the incorporation of phosphorus into the solution reduced the transparency of the films. Furthermore, post-annealing caused irregular and scattered behavior in optical transmittance. The optical band gap of the thin films ranged from 1.52 to 1.74&#xa0;eV to 1.87–1.90&#xa0;eV with phosphorus doping before annealing but shifted to approximately 0.55&#xa0;eV, with phosphorus doping after annealing in phosphorus vapor. Interestingly, before annealing, the bandgap decreased with substrate temperature (1.74 to 1.52&#xa0;eV), whereas after annealing, it decreased, within the range of 2.21 to 2.12&#xa0;eV. FESEM images revealed that the phosphorus cobalt oxide thin films exhibited a porous, sponge-like morphology, which is advantageous for applications such as water splitting and pollutant adsorption.</p>

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The effect of structural phase change on optical properties and bandgap of phosphorus cobalt oxide thin films deposited by spray pyrolysis for oxygen photo-electrocatalyst applications: post-annealing under argon and phosphorus vapor

  • 期刊论文

  • 发表日期：

    2025年8月18日

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  • Abbas Daryani,
  • M. M. Bagheri Mohagheghi,
  • A. Shirpay

摘要

In this study, phosphorus-doped cobalt oxide thin films were synthesized via spray pyrolysis for photo-electrocatalyst applications. The influence of structural phase transformation on the optical properties and bandgap of phosphorus cobalt oxide semiconducting thin films was investigated through post-annealing under argon gas and phosphorus atmosphere. To study the structural, optical, electrical and surface morphological characteristics, various techniques were employed, including X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectroscopy (EDX), and UV–Vis spectroscopy. The XRD analysis revealed that prior to post-annealing in the phosphorus atmosphere, the thin films predominantly exhibited cobalt oxide phases. However, after thermal treatment, most films showed a dominant presence of bi-phase and tri-phase phosphorus cobalt oxide structures. Optical analysis indicated that the incorporation of phosphorus into the solution reduced the transparency of the films. Furthermore, post-annealing caused irregular and scattered behavior in optical transmittance. The optical band gap of the thin films ranged from 1.52 to 1.74 eV to 1.87–1.90 eV with phosphorus doping before annealing but shifted to approximately 0.55 eV, with phosphorus doping after annealing in phosphorus vapor. Interestingly, before annealing, the bandgap decreased with substrate temperature (1.74 to 1.52 eV), whereas after annealing, it decreased, within the range of 2.21 to 2.12 eV. FESEM images revealed that the phosphorus cobalt oxide thin films exhibited a porous, sponge-like morphology, which is advantageous for applications such as water splitting and pollutant adsorption.