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<p>A new non-destructive elemental analysis method using muon-induced gamma-rays was developed to quantify sub-percent components in bulk materials, including light elements. Pulsed muon beam irradiation experiments for iron reference samples containing varying silicon concentrations were conducted to demonstrate the method. Characteristic muonic X-rays and gamma-rays emitted from unstable nuclides generated by muon nuclear absorption were measured using germanium detectors during the beam irradiation. By measuring gamma-rays derived from silicon, we successfully quantified the silicon at a concentration of 0.36 wt.% in the bulk iron sample, which is difficult to detect using conventional muon elemental analysis based solely on X-rays.</p>

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Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2025年12月22日

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  • Makoto Inagaki,
  • Kazuhiko Ninomiya,
  • Go Yoshida,
  • Michael Kenya Kubo,
  • Kosei Yakushi,
  • Eisuke Watanabe,
  • Hiroki Nakada,
  • Izumi Umegaki

摘要

A new non-destructive elemental analysis method using muon-induced gamma-rays was developed to quantify sub-percent components in bulk materials, including light elements. Pulsed muon beam irradiation experiments for iron reference samples containing varying silicon concentrations were conducted to demonstrate the method. Characteristic muonic X-rays and gamma-rays emitted from unstable nuclides generated by muon nuclear absorption were measured using germanium detectors during the beam irradiation. By measuring gamma-rays derived from silicon, we successfully quantified the silicon at a concentration of 0.36 wt.% in the bulk iron sample, which is difficult to detect using conventional muon elemental analysis based solely on X-rays.