X-ray backscattering: design, applications, and prospects in non-destructive evaluation
摘要
Non-destructive testing (NDT) is important in determining the health and quality of industrial commodities and identifying illicit items or threats in security applications. Among various NDT techniques, X-ray backscattering has gained significant attention due to its one-sided geometric setup and its capability to image massive objects where access to both sides is not possible. However, there is a lack of recent literature reviews specifically focusing on X-ray backscattering. Therefore, this review aims to address the gap by comprehensively comparing different studies reported in recent years. The imaging techniques and X-ray backscatter system setup are also discussed, including source, detectors, and collimation designs. Some commonly used commercially available X-ray backscatter devices are also discussed. The paper concludes with a discussion of current challenges and future directions within the current state-of-the-art.
Graphical abstract