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<p>Using<?tk 4?> the melt-quench method, numbers of arrays of boron silicate glasses supplemented with varying amounts of lanthanum (La<sub>2</sub>O<sub>3</sub>) with formula (70-<i>x</i>)B<sub>2</sub>O<sub>3</sub>-5SiO<sub>2</sub>-10Li<sub>2</sub>O-5Bi<sub>2</sub>O<sub>3</sub>-10ZnO-(<i>x</i>)La<sub>2</sub>O<sub>3</sub> are created in this work. The bulk density of the resultant glass sample increases when B<sub>2</sub>O<sub>3</sub> is substituted with La<sub>2</sub>O<sub>3</sub>. Glass molar volume falls as the proportion of La<sub>2</sub>O<sub>3</sub> rises from 0 to 1.2&#xa0;mol%. An infrared spectrometer with Fourier transform has been used to analyze the structure for the glasses in concern. La-ions are added to the network, increasing the number of non-bridging oxygen’s (NBO) ions in the internal molecular structure of the glass. To investigate the dielectric characteristics, a wide range of frequencies were employed. With an increase in La<sub>2</sub>O<sub>3</sub>, the dielectric constant (ε’) rises gradually. The electrical conductivity (σ<sub>ac</sub>) rises as the applied frequency increases. The structure of a glass network breaks down and (NBO) increases when La<sub>2</sub>O<sub>3</sub> is added, which raises σ<sub>ac</sub> and ε’. Effective electron density (N<sub>eff</sub>), effective conduction (C<sub>eff</sub>), equivalent atomic count (Z<sub>eq</sub>), plus exposure buildup factors (EBF) were determined using the G-P fitting method in Phy-X/PSD software. EBF has been calculated for penetration depths of 0.5_40 mfp and photon energy region between 0.015 and 15&#xa0;MeV for the glass system. It has been shown that penetration depths, photon energy, and the La<sub>2</sub>O<sub>3</sub> mol% concentration of the glass sample all affect the reported EBF. Compared to other samples, La-1.2 glass offers better gamma-ray shielding. The study’s findings might also be helpful for radiation shielding usage in industry, health, and nuclear engineering.</p>

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Radiation-Shielding, Dielectric, and FTIR Characteristics of Borosilicate Glasses Boosted with Lanthanum Oxide

  • 期刊论文

  • 发表日期：

    2025年7月3日

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  • Aljawhara Almuqrin,
  • Jamelah S. Al-Otaibi,
  • Norah Alwadai,
  • Badriah Albarzan,
  • M. S. Shams,
  • Yasser S. Rammah,
  • R. A. Elsad

摘要

Using the melt-quench method, numbers of arrays of boron silicate glasses supplemented with varying amounts of lanthanum (La2O3) with formula (70-x)B2O3-5SiO2-10Li2O-5Bi2O3-10ZnO-(x)La2O3 are created in this work. The bulk density of the resultant glass sample increases when B2O3 is substituted with La2O3. Glass molar volume falls as the proportion of La2O3 rises from 0 to 1.2 mol%. An infrared spectrometer with Fourier transform has been used to analyze the structure for the glasses in concern. La-ions are added to the network, increasing the number of non-bridging oxygen’s (NBO) ions in the internal molecular structure of the glass. To investigate the dielectric characteristics, a wide range of frequencies were employed. With an increase in La2O3, the dielectric constant (ε’) rises gradually. The electrical conductivity (σac) rises as the applied frequency increases. The structure of a glass network breaks down and (NBO) increases when La2O3 is added, which raises σac and ε’. Effective electron density (Neff), effective conduction (Ceff), equivalent atomic count (Zeq), plus exposure buildup factors (EBF) were determined using the G-P fitting method in Phy-X/PSD software. EBF has been calculated for penetration depths of 0.5_40 mfp and photon energy region between 0.015 and 15 MeV for the glass system. It has been shown that penetration depths, photon energy, and the La2O3 mol% concentration of the glass sample all affect the reported EBF. Compared to other samples, La-1.2 glass offers better gamma-ray shielding. The study’s findings might also be helpful for radiation shielding usage in industry, health, and nuclear engineering.