EUV and Soft X-ray Spectroscopy of Highly Charged Heavy Ions Using LHD: Research Ranging from Industrial Light Sources to Basic Atomic Physics
摘要
This article reviews various achievements in spectroscopy of highly charged ions of a variety of heavy elements injected into the Large Helical Device (LHD) plasmas. We focus on discrete and quasi-continuum spectra observed in extreme ultraviolet (EUV) and soft X-ray wavelength ranges using multiple grazing incidence spectrometers. In particular, the atomic number dependence and temperature dependence of the spectral features have been investigated more comprehensively than ever before over extremely wide ranges based on comparisons with theoretical models and other experimental data. Consequently, the series of studies could provide an experimental database valuable for investigations of basic atomic physics issues specific to highly charged heavy ions, as well as the applications to industrial light source developments.