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<p>To improve the optical transmittivity of ZnO-based solar window layers, magnesium (Mg) and (Mg, Sn) co-doped Zinc Oxide (ZnO) layers were fabricated on glass-based substrates via an efficient sol–gel spin-coating process. The influence of dopants on the crystallographic structure, morphology, and optical properties of ZnO was systematically investigated using different characterization techniques, including X-ray diffraction (XRD), scanning electron microscopy (SEM), and UV–Visible spectroscopy. XRD results confirmed that all films exhibited the hexagonal wurtzite structure of polycrystalline nature, and crystallite size decreased from 24 to 16&#xa0;nm for (Mg, Sn): ZnO films. SEM analysis revealed enhanced surface homogeneity with the incorporation of Mg and Sn into the ZnO matrix. UV–vis. analysis revealed that the (2 wt.% Mg + 2 wt.% Sn):ZnO film exhibited high visible transmittance (~ 90%) with low reflectance (&lt; 10%) and a slight blue shift in the absorption edge, corresponding to an optical bandgap of 3.36&#xa0;eV. Electrical measurements confirmed n-type conductivity with a minimum resistivity of 15.7 Ω·cm and a maximum carrier concentration of 1.12 × 10<sup>18</sup>&#xa0;cm⁻<sup>3</sup> for the (2% Mg + 2% Sn): ZnO films. The improved transparency and favourable electrical properties suggest that (2 wt.% Mg + 2 wt.% Sn): ZnO thin film could be a potential candidate for use as window layers in solar cells and other advanced optoelectronic applications.</p>

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Fabrication and characterization of Mg and Sn co-doped ZnO thin films with enhanced optical transmittance for solar window layer applications

  • 期刊论文

  • 发表日期：

    2026年5月21日

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  • Sharmin Aktar Mita,
  • Md. Ariful Islam,
  • Muhammad Shahriar Bashar,
  • Md. Al-Mamun,
  • Md. Khalilur Rahman

摘要

To improve the optical transmittivity of ZnO-based solar window layers, magnesium (Mg) and (Mg, Sn) co-doped Zinc Oxide (ZnO) layers were fabricated on glass-based substrates via an efficient sol–gel spin-coating process. The influence of dopants on the crystallographic structure, morphology, and optical properties of ZnO was systematically investigated using different characterization techniques, including X-ray diffraction (XRD), scanning electron microscopy (SEM), and UV–Visible spectroscopy. XRD results confirmed that all films exhibited the hexagonal wurtzite structure of polycrystalline nature, and crystallite size decreased from 24 to 16 nm for (Mg, Sn): ZnO films. SEM analysis revealed enhanced surface homogeneity with the incorporation of Mg and Sn into the ZnO matrix. UV–vis. analysis revealed that the (2 wt.% Mg + 2 wt.% Sn):ZnO film exhibited high visible transmittance (~ 90%) with low reflectance (< 10%) and a slight blue shift in the absorption edge, corresponding to an optical bandgap of 3.36 eV. Electrical measurements confirmed n-type conductivity with a minimum resistivity of 15.7 Ω·cm and a maximum carrier concentration of 1.12 × 1018 cm⁻3 for the (2% Mg + 2% Sn): ZnO films. The improved transparency and favourable electrical properties suggest that (2 wt.% Mg + 2 wt.% Sn): ZnO thin film could be a potential candidate for use as window layers in solar cells and other advanced optoelectronic applications.