Indium-free SiO2/Ag nanowire composite transparent conductive thin films with simultaneous high transparency, low resistance, and superior stability
摘要
Indium-free transparent conductive thin films (TCFs) with high optical transparency, low sheet resistance, and robust mechanical durability are crucial for next-generation flexible optoelectronics. Here, we report a room-temperature dielectric-engineered SiO2/Ag nanowire (Ag NW) composite TCF that simultaneously achieves excellent optoelectronic performance and environmental stability. An ultrathin SiO2 layer is conformally integrated with Ag NW networks, enabling quantum-tunneling-mediated interwire conduction while leveraging the dielectric layer to enhance adhesion, suppress silver oxidation, and improve mechanical robustness. Systematic tuning of nanowire density leads to an optimized composite film exhibiting a transmittance of 88.7% and a sheet resistance of 9.6 Ω/□, comparable to or surpassing traditional ITO at similar transparency. The composite TCF demonstrates outstanding adhesion, long-term storage stability, solvent resistance, and mechanical flexibility, maintaining performance after repeated bending and ultrasonication tests. This work establishes a scalable, fully indium-free, room-temperature strategy for high-performance transparent electrodes and provides a promising platform for flexible displays, wearable electronics, and large-area printed optoelectronic devices.