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<p>This study investigates the influence of RE-oxide dopants on the electrical, dielectric, and optical properties of polyvinyl alcohol (PVA) films doped with rare-earth oxides—Y₂O₃, Pr₆O₁₁, and Ta₂O₅. The PVA-Y<sub>2</sub>O<sub>3</sub>, PVA-Ta<sub>2</sub>O<sub>5</sub>, and PVA-Pr<sub>6</sub>O<sub>11</sub> films with a concentration of 1.5% of the oxides were prepared by the casting method. The X-ray diffractometer and X-ray photoelectron spectroscopy are used to identify changes in the structure of the PVA matrix. Using advanced characterization techniques, including complex impedance spectroscopy (CIS) and dielectric modulus formalism, we analyze the role of oxygen vacancies and interfacial polarization in shaping the films’ performance. A UV–visible spectrophotometer was utilized to assess how varying oxygen levels affect the transmittance of PVA and its bandgap energy. The results reveal that increasing RE-oxide dopants enhances conductivity, dielectric relaxation, and modulus properties by reducing oxygen vacancies and strengthening metal–oxygen bonds. PVA-Ta₂O₅ films demonstrate superior electrical behavior, with the lowest resistive impedance and fastest relaxation dynamics, followed by PVA-Pr₆O₁₁ and PVA-Y₂O₃. This study emphasizes the pivotal role of oxygen control in optimizing the multifunctional properties of PVA-rare earth oxide composites, paving the way for their application in advanced electronic and dielectric devices.</p>

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Impact of rare-earth oxide (Y₂O₃, Ta₂O₅, Pr₆O₁₁) doping on conductivity, dielectric, and optical performance of PVA-nanocomposite films

  • 期刊论文

  • 发表日期：

    2026年3月21日

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  • T. S. Soliman,
  • A. Khalid,
  • Mohamed Taha,
  • Sherief A. Al Kiey

摘要

This study investigates the influence of RE-oxide dopants on the electrical, dielectric, and optical properties of polyvinyl alcohol (PVA) films doped with rare-earth oxides—Y₂O₃, Pr₆O₁₁, and Ta₂O₅. The PVA-Y2O3, PVA-Ta2O5, and PVA-Pr6O11 films with a concentration of 1.5% of the oxides were prepared by the casting method. The X-ray diffractometer and X-ray photoelectron spectroscopy are used to identify changes in the structure of the PVA matrix. Using advanced characterization techniques, including complex impedance spectroscopy (CIS) and dielectric modulus formalism, we analyze the role of oxygen vacancies and interfacial polarization in shaping the films’ performance. A UV–visible spectrophotometer was utilized to assess how varying oxygen levels affect the transmittance of PVA and its bandgap energy. The results reveal that increasing RE-oxide dopants enhances conductivity, dielectric relaxation, and modulus properties by reducing oxygen vacancies and strengthening metal–oxygen bonds. PVA-Ta₂O₅ films demonstrate superior electrical behavior, with the lowest resistive impedance and fastest relaxation dynamics, followed by PVA-Pr₆O₁₁ and PVA-Y₂O₃. This study emphasizes the pivotal role of oxygen control in optimizing the multifunctional properties of PVA-rare earth oxide composites, paving the way for their application in advanced electronic and dielectric devices.