Scholarlink

<p>Thin films of various oxide materials play vital roles in many technological applications. In this study, a zinc oxide (ZnO) thin film was deposited on a glass substrate using the doctor blade method. The prepared ZnO film was characterized using X-ray diffraction, infrared spectroscopy, Raman spectroscopy, AFM, Brunauer–Emmett-Teller, <i>I</i>–<i>V</i> characteristics and UV–visible techniques. The single-phase formation with a hexagonal wurtzite structure was analyzed using XRD peak analysis. Using the Debye–Scherrer formula, the estimated crystallite size was approximately 37&#xa0;nm. The lattice parameters (<i>a</i> = <i>b</i> = 3.20&#xa0;Å, <i>c</i> = 5.13&#xa0;Å) obtained from the XRD data were in good agreement with those reported in the literature. The Fourier transform infrared spectrum characterizes the ZnO thin film by exhibiting two absorption bands at 405&#xa0;cm<sup>−1</sup> and 387&#xa0;cm<sup>−1</sup>. Raman spectrum reveals the <i>E</i><sub>2</sub> mode at 440&#xa0;cm⁻<sup>1</sup> is particularly strong and sharp, indicating good crystalline quality of the wurtzite ZnO structure. The AFM surface morphology analysis revealed a rough, granular structure with multiple peaks and valleys. The specific surface area obtained from the BET analysis was 29.81 m<sup>2</sup>/g. The <i>I</i>–<i>V</i> curves displayed relatively linear behavior, indicating ohmic or near-ohmic conduction characteristics. The optical bandgap obtained from the UV–visible analysis and Tauc plot is of the order of 3.24&#xa0;eV.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Enhanced surface morphology, electrical and optical properties of ZnO thin film deposited by the doctor blade method

  • 期刊论文

  • 发表日期：

    2025年8月30日

查看全文
  • Pooja G. Shinde,
  • Subhash M. Wani,
  • Mahesh T. Kotkar,
  • Aruna G. Patil,
  • K. M. Jadhav

摘要

Thin films of various oxide materials play vital roles in many technological applications. In this study, a zinc oxide (ZnO) thin film was deposited on a glass substrate using the doctor blade method. The prepared ZnO film was characterized using X-ray diffraction, infrared spectroscopy, Raman spectroscopy, AFM, Brunauer–Emmett-Teller, I–V characteristics and UV–visible techniques. The single-phase formation with a hexagonal wurtzite structure was analyzed using XRD peak analysis. Using the Debye–Scherrer formula, the estimated crystallite size was approximately 37 nm. The lattice parameters (a = b = 3.20 Å, c = 5.13 Å) obtained from the XRD data were in good agreement with those reported in the literature. The Fourier transform infrared spectrum characterizes the ZnO thin film by exhibiting two absorption bands at 405 cm−1 and 387 cm−1. Raman spectrum reveals the E2 mode at 440 cm⁻1 is particularly strong and sharp, indicating good crystalline quality of the wurtzite ZnO structure. The AFM surface morphology analysis revealed a rough, granular structure with multiple peaks and valleys. The specific surface area obtained from the BET analysis was 29.81 m2/g. The I–V curves displayed relatively linear behavior, indicating ohmic or near-ohmic conduction characteristics. The optical bandgap obtained from the UV–visible analysis and Tauc plot is of the order of 3.24 eV.