<p>We used the thermal evaporation technique under vacuum to synthesize a series of 100&#xa0;nm Fe_1−<i>x</i>Pd_<i>x</i> thin films onto Si (111) substrate, with x representing the palladium content ranging from 16 to 36&#xa0;at%, as quantified by energy dispersive X-ray spectroscopy tool. We used the X-ray diffraction technique to analyze the structural properties of the films, and the Atomic Force Microscopy tool to explore images of the surface topography and measure the root-mean-square roughness of the films. The crystallite size was found to increase with Pd content. We used the Hall effect measurement system, and the vibrating sample magnetometer tools to investigate the electrical and magnetic properties. Both the electrical resistivity and magnetoresistance increase as the Pd content increases. The saturation magnetization <i>M</i>_s decreases linearly from 1350 emu/cm³ for the Fe₈₄Pd₁₆ thin film to 1270 emu/cm³ for the Fe₆₄Pd₃₆ thin film. Coercivity decreases with increasing Pd content and with increasing crystallite size. All these findings, and others, contribute to a deeper understanding of the electrical and magnetic behaviors of iron-palladium alloys, and expand their industrial applications.</p>