Forming-free and high uniformity in Ca2+-doped CuxO memristors for neuromorphic computing
摘要
Memristors based on metal oxides show great potential for neuromorphic computing. However, their practical implementation is often limited by high forming voltages and unstable switching behavior. In this work, Ca2+-doped CuxO memristors with an ITO/CuₓO(Ca)/ITO structure are fabricated via a solution-based spin-coating process, followed by thermal annealing and magnetron sputtering for top electrode deposition. The introduction of Ca2+ effectively eliminates the forming process, enabling stable forming-free bipolar resistive switching. A systematic investigation of devices with different Ca2+ doping concentrations (0%, 0.25%, 0.5%, and 0.75%) reveals that the optimal performance is achieved at 0.5% doping. The optimized device exhibits a high ON/OFF ratio (> 10), stable set/reset voltages, an endurance of over 104 cycles, and a retention time exceeding 104 s. This improvement arises from Ca2+-induced defect engineering in CuxO films. The increase in Cu+ content and the reduction in film thickness exert a synergistic effect, thereby promoting the stable formation and rupture of conductive filaments. Furthermore, the optimized device successfully emulates key synaptic functions, including short-term plasticity (STP), long-term potentiation (LTP), and spike-timing-dependent plasticity (STDP), demonstrating strong potential for neuromorphic computing applications.
Graphical abstractCa2+ doping substantially enhances the device consistency and synaptic properties of CuxO thin-film devices. Synaptic simulation and pattern recognition experiments further demonstrate their potential for brain-inspired computing applications.