Effect of aging time and temperature on microstructure and properties of Al-Mg-Si alloys
摘要
Al–Mg-Si alloys hold significant importance in overhead transmission lines due to their excellent strength and electrical conductivity. Studying the complex relationship between microstructure evolution and properties of Al–Mg-Si alloys is of great significance. This paper systematically investigates the effects of aging temperature and time on the microstructure and properties of Al–Mg–Si alloys using transmission electron microscopy (TEM) and electron backscatter diffraction (EBSD) techniques. The results indicate that with increasing aging temperature and time, the strength and hardness of the samples gradually decrease, while the elongation and electrical conductivity increase. After aging at different temperatures and times, the grain width of the samples remains 63.5 μm. The sample aged at 160 ℃ for 4 h exhibits the optimal comprehensive properties: a tensile strength of 279.32 MPa, YS of 253.24 MPa, elongation of 10.51%, and electrical conductivity of 57.27% IACS.