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<p>Safety-critical automotive systems require on-chip testing methods to ensure high fault coverage and reliable operation. Periodic Deterministic Logic Built-In Self-Test (DLBIST) is often used to meet these demands. For automotive applications, DLBIST must operate reliably despite temperature variations, including those caused by ambient changes and self-heating in FinFET transistors. A test set effective for all temperatures typically requires a large volume, which can make DLBIST impractical. This paper proposes a robust DLBIST scheme which applies multiple voltages during power-on and power-off tests and the optimal or adapted voltage during periodic tests in system operation. If distributed sensors for on-chip temperature are available for DVFS control, they can be exploited for an adaptive DLBIST scheme. During the periodic test phase, the BIST Control Unit (BCU) dynamically selects and applies the pre-generated test set corresponding to the current operating voltage and measured temperature. This adaptive selection ensures that testing conditions precisely match the real operating points. If temperature sensors are not available, testing at the so-called Zero Temperature Coefficient (ZTC) voltage is one alternative, which is the voltage where the temperature-induced variability is minimized. This makes periodic DLBIST a feasible solution for in-field self-testing, even in cases where on-chip temperature sensors are not available.</p>

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Robust Adaptive DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年6月1日

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  • Hanieh Jafarzadeh,
  • Florian Klemme,
  • Hussam Amrouch,
  • Sybille Hellebrand,
  • Hans-Joachim Wunderlich

摘要

Safety-critical automotive systems require on-chip testing methods to ensure high fault coverage and reliable operation. Periodic Deterministic Logic Built-In Self-Test (DLBIST) is often used to meet these demands. For automotive applications, DLBIST must operate reliably despite temperature variations, including those caused by ambient changes and self-heating in FinFET transistors. A test set effective for all temperatures typically requires a large volume, which can make DLBIST impractical. This paper proposes a robust DLBIST scheme which applies multiple voltages during power-on and power-off tests and the optimal or adapted voltage during periodic tests in system operation. If distributed sensors for on-chip temperature are available for DVFS control, they can be exploited for an adaptive DLBIST scheme. During the periodic test phase, the BIST Control Unit (BCU) dynamically selects and applies the pre-generated test set corresponding to the current operating voltage and measured temperature. This adaptive selection ensures that testing conditions precisely match the real operating points. If temperature sensors are not available, testing at the so-called Zero Temperature Coefficient (ZTC) voltage is one alternative, which is the voltage where the temperature-induced variability is minimized. This makes periodic DLBIST a feasible solution for in-field self-testing, even in cases where on-chip temperature sensors are not available.