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<p>Reliability evaluation is an essential prerequisite in modern nanotechnology-based circuit design. The Probability Transfer Matrix (PTM) is a reliable tool for analyzing the correctness and transient defects of digital logic circuits. The circuits’ intended outputs are distorted as a result of various mistakes, including noise from radiation and manufacturing flaws. Both data flowing through cables and the outputs of logic gates can be impacted by radiation noise. This paper introduces an enhanced PTM-based reliability analysis of a one-bit full adder circuit implemented in QCA. Unlike prior works that limited PTM analysis to basic gates, the present study integrates a reduced tensoring technique for computational simplification and improved accuracy. The proposed method eliminates redundant PTM states generated during tensor product operations between 3-input XOR and majority voter (MV) gates, achieving approximately 35% reduction in matrix complexity. Simulation results demonstrate a substantial improvement in reliability performance, where the proposed QCA full adder achieves an incorrect output probability of 0.25 at a 50% gate error rate, compared to 0.5 and 0.74 reported in earlier studies by Ibrahim et al. (2008) and Alkaldy et al. (2013). These outcomes confirm the superiority and methodological novelty of the proposed PTM-based approach in analyzing and enhancing circuit reliability in QCA nanotechnology.</p>

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Reliability evaluation of a one-bit full adder based on probability transfer matrix using QCA technology

  • 期刊论文

  • 发表日期：

    2026年2月20日

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  • Sachindeb Jana,
  • Kisalaya Chakrabarti,
  • Angsuman Sarkar

摘要

Reliability evaluation is an essential prerequisite in modern nanotechnology-based circuit design. The Probability Transfer Matrix (PTM) is a reliable tool for analyzing the correctness and transient defects of digital logic circuits. The circuits’ intended outputs are distorted as a result of various mistakes, including noise from radiation and manufacturing flaws. Both data flowing through cables and the outputs of logic gates can be impacted by radiation noise. This paper introduces an enhanced PTM-based reliability analysis of a one-bit full adder circuit implemented in QCA. Unlike prior works that limited PTM analysis to basic gates, the present study integrates a reduced tensoring technique for computational simplification and improved accuracy. The proposed method eliminates redundant PTM states generated during tensor product operations between 3-input XOR and majority voter (MV) gates, achieving approximately 35% reduction in matrix complexity. Simulation results demonstrate a substantial improvement in reliability performance, where the proposed QCA full adder achieves an incorrect output probability of 0.25 at a 50% gate error rate, compared to 0.5 and 0.74 reported in earlier studies by Ibrahim et al. (2008) and Alkaldy et al. (2013). These outcomes confirm the superiority and methodological novelty of the proposed PTM-based approach in analyzing and enhancing circuit reliability in QCA nanotechnology.