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<p>Features of Doppler-free resonances formed during scanning of Cs-atom 6<i>S</i><sub>1/2</sub> → 7<i>P</i><sub>3/2</sub> transitions at 456 nm in a micrometer cell are presented. The saturated absorption technique in a cell with a thickness of <i>L</i> = 40 μm was used. The oscillator strength of these transitions is 60 times weaker than for Cs 6<i>S</i><sub>1/2</sub> → 6<i>P</i><sub>3/2</sub> transitions at 852 nm. The Doppler-free resonances have a spectral line width of &lt;20 MHz, which is 38 times smaller than the Doppler line width of 750 MHz at 120°C. These narrow resonances are of interest for both high-resolution spectroscopy and instrumentation, in particular, the creation of compact frequency references in the blue region.</p>

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Micrometric Atomic Layer Saturated Absorption Spectroscopy for Studying Cesium 6S1/2 → 7P3/2 Transitions at 456 nm

  • 期刊论文

  • 发表日期：

    2025年9月11日

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  • A. Sargsyan,
  • D. Sarkisyan

摘要

Features of Doppler-free resonances formed during scanning of Cs-atom 6S1/2 → 7P3/2 transitions at 456 nm in a micrometer cell are presented. The saturated absorption technique in a cell with a thickness of L = 40 μm was used. The oscillator strength of these transitions is 60 times weaker than for Cs 6S1/2 → 6P3/2 transitions at 852 nm. The Doppler-free resonances have a spectral line width of <20 MHz, which is 38 times smaller than the Doppler line width of 750 MHz at 120°C. These narrow resonances are of interest for both high-resolution spectroscopy and instrumentation, in particular, the creation of compact frequency references in the blue region.