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<p>Wheat leaf rust, caused by <i>Puccinia triticina</i> Eriks. (<i>Pt</i>), is a globally prevalent disease in wheat-growing regions and poses a serious biological threat to global wheat production. In this study, the genetic basis of resistance to diverse <i>Pt</i> isolates was systematically investigated by integrating phenotypic evaluations with molecular marker analyses. Seedling-stage resistance was assessed against seven <i>Pt</i> isolates using 209 wheat cultivars and 36 differential lines carrying known <i>Lr</i> genes. In parallel, adult-plant slow rusting resistance was evaluated through two consecutive years of field trials (2021–2023) conducted in Baoding, Hebei Province. Molecular detection using eleven functional markers linked to nine <i>Lr</i> genes, together with gene postulation, identified a total of twenty-three resistance genes: <i>Lr1</i>, <i>Lr3ka</i>, <i>Lr10</i>, <i>Lr13</i>, <i>Lr14a</i>, <i>Lr17</i>, <i>Lr18</i>, <i>Lr20</i>, <i>Lr21</i>, <i>Lr23</i>, <i>Lr24</i>, <i>Lr26</i>, <i>Lr28</i>, <i>Lr29</i>, <i>Lr30</i>, <i>Lr33</i>, <i>Lr37</i>, <i>Lr42</i>, <i>Lr44</i>, <i>Lr45</i>, <i>Lr47</i>, <i>Lr51</i> and <i>Lr2b</i> across 161 wheat cultivars. Among these, <i>Lr26</i> (38.7%), <i>Lr1</i> (32.1%) and <i>Lr10</i> (28.4%) were the most frequently detected, predominantly occurred in combination with other <i>Lr</i> genes. Notably, 54 cultivars exhibited slow-rusting resistance under field conditions, including nine seedling-susceptible accessions that showed a 62.3–78.5% reduction in lesion expansion rates compared with susceptible controls, suggesting the presence of previously undetected adult-plant resistance (APR) genes. Collectively, these results highlight the synergistic effects of <i>Lr</i> gene combinations and provide a robust molecular marker-assisted selection framework for breeding wheat cultivars with durable resistance to leaf rust.</p>

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Integrating molecular markers with phenotypic screening unveils the genetic architecture of leaf rust resistance in Chinese wheat

  • 期刊论文

  • 发表日期：

    2026年5月7日

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  • Zhiying Chu,
  • Jiaxin Xi,
  • Ling Kang,
  • Huaizhi Zhang,
  • Xinyi Jiang,
  • Jingxu Zhang,
  • Jin Liu,
  • Shiqi Sun,
  • Jialong Liu,
  • Zhanjun Yao,
  • Xiaocui Yan

摘要

Wheat leaf rust, caused by Puccinia triticina Eriks. (Pt), is a globally prevalent disease in wheat-growing regions and poses a serious biological threat to global wheat production. In this study, the genetic basis of resistance to diverse Pt isolates was systematically investigated by integrating phenotypic evaluations with molecular marker analyses. Seedling-stage resistance was assessed against seven Pt isolates using 209 wheat cultivars and 36 differential lines carrying known Lr genes. In parallel, adult-plant slow rusting resistance was evaluated through two consecutive years of field trials (2021–2023) conducted in Baoding, Hebei Province. Molecular detection using eleven functional markers linked to nine Lr genes, together with gene postulation, identified a total of twenty-three resistance genes: Lr1, Lr3ka, Lr10, Lr13, Lr14a, Lr17, Lr18, Lr20, Lr21, Lr23, Lr24, Lr26, Lr28, Lr29, Lr30, Lr33, Lr37, Lr42, Lr44, Lr45, Lr47, Lr51 and Lr2b across 161 wheat cultivars. Among these, Lr26 (38.7%), Lr1 (32.1%) and Lr10 (28.4%) were the most frequently detected, predominantly occurred in combination with other Lr genes. Notably, 54 cultivars exhibited slow-rusting resistance under field conditions, including nine seedling-susceptible accessions that showed a 62.3–78.5% reduction in lesion expansion rates compared with susceptible controls, suggesting the presence of previously undetected adult-plant resistance (APR) genes. Collectively, these results highlight the synergistic effects of Lr gene combinations and provide a robust molecular marker-assisted selection framework for breeding wheat cultivars with durable resistance to leaf rust.