Metastability-based random number generator with current-controlled offset compensation
摘要
The paper presents the design and measurement results of a metastability based true random number generator (TRNG) core, which was fabricated with HHGRACE 130-nm CMOS technology. Design and simulation results of a complete TRNG intended for hardware cryptographic systems, internet-of-things (IoT), smartcards and secure communication applications is also presented. Random numbers are generated from the differential noise occurring at the StrongARM comparator inputs. Tests were carried out at 0