Scholarlink

<p>A microchannel plates (MCPs) photon-counting detector with a cross-delay line (XDL) is expected for high-quality and wide-field target imaging. However, it is a great challenge for the uniformity of system response as the increasing of effective detection area. In this article, we develop a XDL photon-counting detector with a wide field of 120&#xa0;mm × 50&#xa0;mm. Additionally, we investigate the origin of image distortion and propose a partial polynomial correction method to alleviate it. The experimental results show that the drift correction index is improved by around 60% under the proposed method, which confirms that the partial polynomial correction method has general applicability and high efficiency in addressing distortion issues.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Image distortion correction based on partial polynomial model for a large-array photon-counting detector

  • 期刊论文

  • 发表日期：

    2025年2月13日

查看全文
  • Yue Li,
  • Lizhi Sheng,
  • Yong’an Liu,
  • Ruili Zhang,
  • Xianghui Yang,
  • Zhe Liu,
  • Yalong Zhang

摘要

A microchannel plates (MCPs) photon-counting detector with a cross-delay line (XDL) is expected for high-quality and wide-field target imaging. However, it is a great challenge for the uniformity of system response as the increasing of effective detection area. In this article, we develop a XDL photon-counting detector with a wide field of 120 mm × 50 mm. Additionally, we investigate the origin of image distortion and propose a partial polynomial correction method to alleviate it. The experimental results show that the drift correction index is improved by around 60% under the proposed method, which confirms that the partial polynomial correction method has general applicability and high efficiency in addressing distortion issues.