<p>This study investigates the corrosion behaviour and defect characteristics of titanium modified through cathodic plasma electrolytic nitriding (cPEN), followed by post-annealing for bipolar plate applications in proton exchange membrane fuel cells (PEMFCs). The cPEN treatment and post-annealing reveal the formation of non-stoichiometric nitride and oxynitride phases. Potentiodynamic polarisation measurements show that cPEN-treated Ti (PEN Ti) exhibits the lowest corrosion current density (4.18 μAcm⁻<sup>2</sup>) and passive current density (45.08 μAcm⁻<sup>2</sup>) at 0.6&#xa0;V under simulated PEMFC cathodic conditions compared to bare Ti, and annealed PEN Ti (A-PEN Ti). Electrochemical impedance spectroscopy at 0.6&#xa0;V reveals enhanced corrosion resistance for the bare Ti. Mott–Schottky analysis reveals variations in defect distribution, with PEN Ti exhibiting a lower donor density compared to both bare and A-PEN Ti. Post-annealing enhances the long-term passivation behaviour of the cPEN-treated sample during potentiostatic polarisation. Bare Ti performs better in the PEMFC environment owing to its compact passive layer and its defect structure. Whereas nitriding and post-annealing alter its defect distribution, which affects the long-term corrosion performance. These findings emphasise the critical role of defect chemistry in tailoring corrosion performance in the PEMFC environment.</p> Graphical abstract <p></p>

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Corrosion and semiconducting behaviour of cathodic plasma electrolytic nitrided titanium and post-annealed surfaces in simulated cathodic PEMFC environment

  • Badrinath Ramesh,
  • Jitendra Chavhan,
  • Lakshman Neelakantan

摘要

This study investigates the corrosion behaviour and defect characteristics of titanium modified through cathodic plasma electrolytic nitriding (cPEN), followed by post-annealing for bipolar plate applications in proton exchange membrane fuel cells (PEMFCs). The cPEN treatment and post-annealing reveal the formation of non-stoichiometric nitride and oxynitride phases. Potentiodynamic polarisation measurements show that cPEN-treated Ti (PEN Ti) exhibits the lowest corrosion current density (4.18 μAcm⁻2) and passive current density (45.08 μAcm⁻2) at 0.6 V under simulated PEMFC cathodic conditions compared to bare Ti, and annealed PEN Ti (A-PEN Ti). Electrochemical impedance spectroscopy at 0.6 V reveals enhanced corrosion resistance for the bare Ti. Mott–Schottky analysis reveals variations in defect distribution, with PEN Ti exhibiting a lower donor density compared to both bare and A-PEN Ti. Post-annealing enhances the long-term passivation behaviour of the cPEN-treated sample during potentiostatic polarisation. Bare Ti performs better in the PEMFC environment owing to its compact passive layer and its defect structure. Whereas nitriding and post-annealing alter its defect distribution, which affects the long-term corrosion performance. These findings emphasise the critical role of defect chemistry in tailoring corrosion performance in the PEMFC environment.

Graphical abstract