<p>Spatio-spectral measurement of ultrashort-pulse beam is very important for the performance optimization of laser facilities. A reference-free, spectrally resolved measurement method based on ptychography with an advanced iterative algorithm for high-precision synthesis of full-spectrum data is proposed. We designed an integrated measurement device with robust implementation and high reliability. The device was successfully applied in a target chamber of a terawatt-class ultrashort-pulse laser facility. The spatio-spectral complex amplitude of a complicated pulsed laser was accurately reconstructed with high spatial resolution of 11&#xa0;μm and some wavelength-dependent spatial phase characteristics in the laser pulse were identified. This method offers a promising approach for advanced beam characterization of high-power femtosecond laser system.</p>

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Spatio-spectral characterization of ultrashort-pulse laser with wavelength-scanning ptychography

  • Qiang Zhang,
  • Xuejie Zhang,
  • Ping Zhu,
  • Xiaomeng Sun,
  • Qingfan Wu,
  • Xiuyu Yao,
  • Dongjun Zhang,
  • Shiyou Chen,
  • Cheng Liu,
  • Yanying Zhao,
  • Wenjun Ma,
  • Xueqing Yan,
  • Jianqiang Zhu

摘要

Spatio-spectral measurement of ultrashort-pulse beam is very important for the performance optimization of laser facilities. A reference-free, spectrally resolved measurement method based on ptychography with an advanced iterative algorithm for high-precision synthesis of full-spectrum data is proposed. We designed an integrated measurement device with robust implementation and high reliability. The device was successfully applied in a target chamber of a terawatt-class ultrashort-pulse laser facility. The spatio-spectral complex amplitude of a complicated pulsed laser was accurately reconstructed with high spatial resolution of 11 μm and some wavelength-dependent spatial phase characteristics in the laser pulse were identified. This method offers a promising approach for advanced beam characterization of high-power femtosecond laser system.