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<p>B-site vacancy is introduced by component design to provide an easy way to detect samarium substitution defects in Sm-doped 0.68PMN-0.32PT ceramics (The optimum d<sub>33</sub> = 1004 pC/N for x = 0.025). The thorough examination of defects through positron annihilation lifetime and coincidence Doppler broadening spectroscopy indicates that with increasing Sm doping, <InlineEquation ID="IEq111"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq111.gif" Format="GIF" Height="18" Rendition="HTML" Resolution="72" Type="Linedraw" Width="44" /> </InlineMediaObject> <EquationSource Format="TEX">\(\:{Sm}_{Pb}^{.}\)</EquationSource> </InlineEquation> defects as well as <InlineEquation ID="IEq723"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq723.gif" Format="GIF" Height="23" Rendition="HTML" Resolution="72" Type="Linedraw" Width="28" /> </InlineMediaObject> <EquationSource Format="TEX">\(V_B^{''''}\)</EquationSource> </InlineEquation> related defects increase, while <InlineEquation ID="IEq823"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq823.gif" Format="GIF" Height="23" Rendition="HTML" Resolution="72" Type="Linedraw" Width="22" /> </InlineMediaObject> <EquationSource Format="TEX">\(V_A^{''}\)</EquationSource> </InlineEquation> and <InlineEquation ID="IEq923"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq923.gif" Format="GIF" Height="18" Rendition="HTML" Resolution="72" Type="Linedraw" Width="29" /> </InlineMediaObject> <EquationSource Format="TEX">\(V_o^{ \bullet \bullet }\)</EquationSource> </InlineEquation> decrease. The correlation analysis between the variation of <InlineEquation ID="IEq112"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq111.gif" Format="GIF" Height="18" Rendition="HTML" Resolution="72" Type="Linedraw" Width="44" /> </InlineMediaObject> <EquationSource Format="TEX">\(\:{Sm}_{Pb}^{.}\)</EquationSource> </InlineEquation> defects and the results of dielectric, piezoelectric and ferroelectric tests offers powerful and conclusive proof that <InlineEquation ID="IEq113"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq111.gif" Format="GIF" Height="18" Rendition="HTML" Resolution="72" Type="Linedraw" Width="44" /> </InlineMediaObject> <EquationSource Format="TEX">\(\:{Sm}_{Pb}^{.}\)</EquationSource> </InlineEquation> defects contribute to the local structural heterogeneity as well as the variation of T<sub>C</sub>. The variation of ferroelectric, dielectric and piezoelectric parameters with Sm-doping content is ascribed to the superposition effect of the contribution from <InlineEquation ID="IEq678"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq678.gif" Format="GIF" Height="18" Rendition="HTML" Resolution="72" Type="Linedraw" Width="44" /> </InlineMediaObject> <EquationSource Format="TEX">\(Sm_{Pb}^ \cdot\)</EquationSource> </InlineEquation> defects and the contribution from <InlineEquation ID="IEq478"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="339_2025_8552_Article_IEq478.gif" Format="GIF" Height="23" Rendition="HTML" Resolution="72" Type="Linedraw" Width="80" /> </InlineMediaObject> <EquationSource Format="TEX">\(V_A^{''}\,V_B^{''''}\,V_o^{ \bullet \bullet }\)</EquationSource> </InlineEquation>.</p>

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The evidence of samarium substitution defect contributing to local structural-polar heterogeneity and Tc in Sm-doped 0.68PMN-0.32PT ceramics compensated by B-site vacancies

  • 期刊论文

  • 发表日期：

    2025年5月26日

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  • Jing Yang,
  • Wenjun Wang,
  • Yan Li,
  • Shaorong Feng,
  • Tao Zhang,
  • Xuping Niu,
  • Min Li,
  • Li’An Han,
  • Xingzhong Cao,
  • Runsheng Yu,
  • Baoyi Wang

摘要

B-site vacancy is introduced by component design to provide an easy way to detect samarium substitution defects in Sm-doped 0.68PMN-0.32PT ceramics (The optimum d33 = 1004 pC/N for x = 0.025). The thorough examination of defects through positron annihilation lifetime and coincidence Doppler broadening spectroscopy indicates that with increasing Sm doping, \(\:{Sm}_{Pb}^{.}\) defects as well as \(V_B^{''''}\) related defects increase, while \(V_A^{''}\) and \(V_o^{ \bullet \bullet }\) decrease. The correlation analysis between the variation of \(\:{Sm}_{Pb}^{.}\) defects and the results of dielectric, piezoelectric and ferroelectric tests offers powerful and conclusive proof that \(\:{Sm}_{Pb}^{.}\) defects contribute to the local structural heterogeneity as well as the variation of TC. The variation of ferroelectric, dielectric and piezoelectric parameters with Sm-doping content is ascribed to the superposition effect of the contribution from \(Sm_{Pb}^ \cdot\) defects and the contribution from \(V_A^{''}\,V_B^{''''}\,V_o^{ \bullet \bullet }\) .